Light emission microscope sample
A light emission microscope and sample technology, which is used in optical testing for flaws/defects, electronic circuit testing, semiconductor/solid-state device testing/measurement, etc. The adhesive is easy to contaminate the surface of the chip and other problems, so as to achieve the effect of convenient detection, convenient and fast preparation, and high quality
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[0020] Because the existing light emission microscope sample needs to use transparent adhesive because the chip is stuck on the transparent substrate, it is easy to cause air bubbles between the back of the chip and the transparent substrate, which will have a great impact on the image obtained from the back of the light emission microscope sample, so The quality of the obtained light emission microscope sample is not good; after the light emission microscope analysis, the light emission microscope sample is removed from the transparent substrate, the adhesive is easy to stain the surface of the chip, which has a great impact on the reprocessing of the subsequent failure analysis. In the present invention, the solid-mounting component is used to carry the chip and fix the chip on the transparent substrate. Since there is no need to use an adhesive to bond the chip and the transparent substrate, no air bubbles will be generated, and the image obtained from the back of the light e...
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