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Signal conversion device embedded with self test

A conversion device and signal technology, applied in code conversion, analog-to-digital converter, analog-to-digital conversion, etc., can solve problems such as high cost, large increase in chip area, and low yield

Inactive Publication Date: 2010-09-15
ELAN MICROELECTRONICS CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the resistor network suffers from low yield in the analog-to-digital converter, and the capacitor network remains highly matched in the presence of low yield in the resistor network
In addition, if a built-in self-test (Built-in Self Test, BIST) circuit is used to test the cumulative non-linear error of the analog-to-digital converter, the ramp generator included in the circuit will greatly increase the chip area; if an analog tester is used costly and time-consuming

Method used

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  • Signal conversion device embedded with self test
  • Signal conversion device embedded with self test
  • Signal conversion device embedded with self test

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Embodiment Construction

[0012] Please refer to figure 1 , figure 1 Shown is a simplified diagram of an embodiment of the signal conversion device 100 with built-in self-test of the present invention. The signal conversion device 100 includes a first signal conversion circuit 101 , a second signal conversion circuit 102 , a comparison device 103 , a control logic device 104 , a voltage divider 105 and a fifth switch device 106 . The signal conversion device 100 of the present embodiment is illustrated by a 12-bit analog-to-digital device, but the present invention is not limited to 12-bit, and it can also be any one-bit analog-to-digital device; the first signal conversion circuit 101 and The second signal conversion circuit 102 is a 6-bit digital-to-simulator, and the voltage divider 105 also has a 6-bit 64-component voltage, but it is not limited to 6-bit, and it can also be any that can form 12-bit For example, the first signal conversion circuit 101 and the second signal conversion circuit 102 a...

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Abstract

The invention discloses a built-in self-testing signal conversion device which comprises a first signal conversion circuit, a second signal conversion circuit, a comparer, a control logic device and a voltage divider, wherein both signal conversion circuits are used to receive a first reference voltage, a second reference voltage and the control of the first group of control signal and the secondgroup of control signal generated by the control logic device; therefore, the comparer can generate a comparison result.

Description

field of invention [0001] The present invention relates to an analog-to-digital converter with built-in self-test, in particular to an analog-to-digital converter that uses capacitance to measure capacitance to observe whether the highest resolution requirement is met, and then uses capacitance to measure resistance to observe whether the resistance meets another resolution requirement. converter. Background technique [0002] The existing N-bit continuous progressive (Successive-Approximation Register, SAR) analog-to-digital converter (Analog to Digital Converter, ADC) often uses a resistor network (resistor string) to translate the most significant bit (most significant bit, MSB) Code, and use the capacitor network (capacitor array) to decode the least significant bit (least significant bit, LSB), where the error of each resistor of the resistor network must reach (N+1) bits, and the equivalent capacitance of the capacitor network The error must reach (N / 2+1) bits, and th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03M1/10H03M1/12H03M1/38
Inventor 杨昭锜樊曜仁
Owner ELAN MICROELECTRONICS CORPORATION