Assembled probe body
An assembly and probe technology, which is applied to measurement devices, semiconductor/solid-state device testing/measurement, thin plate connection, etc., can solve problems such as being unable to be inspected by the inspected body, and achieves prevention of probe bending, stable position, and easy assembly operations. Effect
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[0033] Referring to Figure 1 and figure 2 , the probe assembly 10 includes: a block 12; a plurality of strip-shaped probes 14, which are arranged side by side on the lower side of the block 12; a pair of elongated guide rods 16, which probe through the needle 14; a pair of grooved rods 18, which accommodates a part of the probe 14; a pair of support pins 20, respectively extending through the front end side and the rear end side of the probe 14; a pair of side covers 22, which support the guide rod 16 and the support pin 20 on the block body 12.
[0034] In addition, in the present invention, the thickness direction of the block 12 ( figure 2 In the up and down direction) is called the up and down direction, the length direction of the probe 14 ( figure 2 The left-right direction) is called the front-to-back direction, and the length direction of the guide rod 16 ( figure 2 The front-to-back direction of the paper) is called the left-right direction.
[0035] The block bod...
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