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Assembled probe body

An assembly and probe technology, which is applied to measurement devices, semiconductor/solid-state device testing/measurement, thin plate connection, etc., can solve problems such as being unable to be inspected by the inspected body, and achieves prevention of probe bending, stable position, and easy assembly operations. Effect

Active Publication Date: 2008-10-08
NIHON MICRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In such a probe assembly, the object to be inspected cannot be accurately inspected

Method used

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  • Assembled probe body
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  • Assembled probe body

Examples

Experimental program
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Effect test

Embodiment Construction

[0033] Referring to Figure 1 and figure 2 , the probe assembly 10 includes: a block 12; a plurality of strip-shaped probes 14, which are arranged side by side on the lower side of the block 12; a pair of elongated guide rods 16, which probe through the needle 14; a pair of grooved rods 18, which accommodates a part of the probe 14; a pair of support pins 20, respectively extending through the front end side and the rear end side of the probe 14; a pair of side covers 22, which support the guide rod 16 and the support pin 20 on the block body 12.

[0034] In addition, in the present invention, the thickness direction of the block 12 ( figure 2 In the up and down direction) is called the up and down direction, the length direction of the probe 14 ( figure 2 The left-right direction) is called the front-to-back direction, and the length direction of the guide rod 16 ( figure 2 The front-to-back direction of the paper) is called the left-right direction.

[0035] The block bod...

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PUM

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Abstract

The present invention provides a probe assembling body which can prevent bending of a probe when the probe runs through a directing lever of a through hole of the probe assembling body. The probe assembling body includes: a block body; multi plate probes, having a band-shaped middle area and the first and second needlepoint area further extending from the front end and the back end of the middle area to forward and rearward respectively, and the multi-probe arranged side by side at the lower side of the block body for being face to face state with width direction being top and bottom direction at the middle area; at least one slender directing lever through the middle area of the probe and extending; at least one rest pin through the front side of the middle area or the first needlepoint area and extending; a pair of plate side covers, which can be mounted at side of the block body relative to the block body disassembly mode, supporting the directing lever and the rest pin at the end of the directing lever and the rest pin along length direction.

Description

technical field [0001] The present invention relates to a probe assembly for inspecting a flat plate-shaped object to be inspected such as a liquid crystal display panel. Background technique [0002] As one of the probe assemblies for inspecting a flat plate-shaped object to be inspected such as a liquid crystal display panel, there is a probe assembly as follows: As shown in FIG. 7 , a plurality of plate-shaped probes 100 each have: A shape middle region 102, a first needle tip region 104 extending forward from the front end of the middle region 102, and a second needle tip region 106 further extending rearward from the rear end of the middle region 102 are placed on the lower side of the block body 108. The plurality of probes 100 are arranged side by side in such a manner that the width direction of these intermediate regions 102 is in the up-down direction, and the intermediate regions 102 are opposed to each other. A pair of side covers 112 are supported on the block ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/073G02F1/13
CPCF16B5/02G01R1/073G01R3/00G09G3/006H01L22/30
Inventor 久我智昭六户树理
Owner NIHON MICRONICS