Linear phase inversion wavefront sensor based on disrete lighting intensity measuring device

Abstract

The invention relates to a linear phase inversion wavefront sensor based on a discrete lumen output measuring device. A diffraction imaging optical system is fixed on an axial translation platform; a microlens array is fixed on a vertical raising platform and positioned on a defocusing plane behind the diffraction imaging optical system; an optical matched amplifying system is positioned on a defocusing plane behind the microlens array; a discrete lumen output measuring device set is positioned behind the optical matched amplifying system and respectively fixed on two axial translation platforms; the optical devices are placed on a base; a parallel light source obtains a distant-field facula image under the aberration-free condition by the diffraction imaging optical system, then obtains discrete sub-beams by the microlens array and is coupled to the corresponding discrete lumen output measuring device set by the optical matched amplifying system for data acquisition; an A / D card is utilized to acquire corresponding data to a PC computer for carrying out data processing. The wavefront sensor uses the discrete lumen output measuring device to acquire distant-filed image data and has higher sensitivity of lumen output; and the device is easy to be obtained and wide in applicability.

Description

technical field [0001] The invention belongs to the technical field of optical information measurement, and relates to a sensor for measuring the wavefront of an incident light beam, in particular to a linear phase inversion wavefront sensor based on a discrete light intensity measuring device. Background technique [0002] In applications such as adaptive optics, optical inspection, and beam diagnostics, it is necessary to measure the wavefront of a beam. Especially in adaptive optics systems, fast measurement of wavefront information is required for real-time control of the wavefront. The wavefront sensor usually continuously measures the phase distortion of the dynamic incident wavefront on the entrance pupil surface in real time, and provides real-time control signals for the wavefront corrector, so that the optical system can achieve a near-diffraction-limited image quality level. At present, many kinds of wavefront sensors for measuring wavefront have been developed, ...

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Problems solved by technology

[0021] However, this patent only proposed this algorithm, and did not propose a specific wavefront sensor structure, and applied it to actual wavefront detection

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