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Method and apparatus for adjusting pitch of buffer tray in test sorter

An adjustment method and buffer tray technology, applied in the buffer tray field, can solve problems such as weight increase

Inactive Publication Date: 2009-02-25
SECRON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the weight of the pitch adjustment mechanism increases as the number of pickers increases, there is a limit to shortening the time required to transport semiconductor devices

Method used

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  • Method and apparatus for adjusting pitch of buffer tray in test sorter
  • Method and apparatus for adjusting pitch of buffer tray in test sorter
  • Method and apparatus for adjusting pitch of buffer tray in test sorter

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Embodiment Construction

[0049] Embodiments of the present invention will now be described in detail with reference to the accompanying drawings showing embodiments of the present invention. However, this invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are presented so that this will be a thorough and complete disclosure, and will fully convey the scope of the invention to those skilled in the art. Similar elements are marked with similar reference numerals throughout the specification.

[0050] It will be understood that when an element or layer is referred to as being "on" it can be directly on it or there may be an element or layer resident therein. In contrast, when an element is referred to as being "directly on" there are no intervening elements or layers present. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0051] It s...

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PUM

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Abstract

In a method and an apparatus for adjusting a pitch of a buffer tray for receiving semiconductor devices, the buffer tray includes a plurality of pairs of unit buffer trays to receive the semiconductor devices. A first pitch between the pairs of unit buffer trays is adjusted by a first driving section. A second pitch between first unit buffer trays and second unit buffer trays in the pairs is adjusted by a second driving section. The semiconductor devices are transferred between a test tray and a customer tray via the buffer tray having the adjusted pitch in a test handler. Accordingly, the time required to transfer the semiconductor devices may be shortened.

Description

[0001] Cross References to Related Applications [0002] This application claims priority from Korean Patent Application No. 2007-84341 filed with the Korean Intellectual Property Office on Aug. 22, 2007, the contents of which are hereby incorporated by reference in their entirety. technical field [0003] The invention relates to a device for testing semiconductor devices. In particular, the present invention relates to a buffer tray for accommodating semiconductor devices in a test handler for testing semiconductor devices. Background technique [0004] Generally, a semiconductor device such as a volatile or nonvolatile memory, a system large-scale integration (LSI) device, etc., is shipped after testing its operating characteristics. [0005] A test handler transfers semiconductor devices into a test chamber for testing the semiconductor devices. Specifically, the semiconductor device is transferred from a customer tray to a test tray through a buffer tray. In additio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/677B65G49/00B65G37/00B65G47/26B65G47/90G01R1/02G01R31/26G01R31/28B07C5/00
CPCH01L21/67333G01R31/2893G01R31/26H01L22/00
Inventor 李镇焕
Owner SECRON