Base wave and harmonic detecting method based on Kaiser window double-line spectrum insert value FFT
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 湖南海兴电器有限责任公司
- Publication Date
- 2009-05-27
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a method for detecting fundamental wave and harmonic parameters in signals. Specifically, it is a fundamental wave and harmonic parameter detection method based on Kaiser window bispectral interpolation FFT (fast Fourier transform), which belongs to the technical field of signal processing and can also be used for spectrum analysis of other signals. Background technique
[0002] Taking power signal detection as an example, with the development of power electronics technology, non-linear devices are widely used in power systems, and the harmonic problems brought by non-linear devices pose an increasingly serious threat to the safety, stability and economic operation of power systems. Accurate measurement of fundamental and harmonics can provide scientific basis for power grid energy metering, harmonic power flow calculation, equipment network detection, power system harmonic compensation and suppression, etc.
[0003] Fundament...