Wet method corrosion process for silicon nitride film
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SHANGHAI HUAHONG GRACE SEMICON MFG CORP
- Publication Date
- 2009-06-10
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to a process method for manufacturing a semiconductor device, in particular to a silicon nitride film wet etching process method. Background technique
[0002] At present, there are two main wet etching methods for silicon nitride film used in the semiconductor manufacturing process. The silicon nitride film is completely etched in a single phosphoric acid tank and cleaned with a single high-temperature water washing tank after over-etching, or continuous 2 The silicon nitride film is etched step by step in two phosphoric acid tanks (single tank for silicon nitride film etching, single tank for over-etching), and then a single high-temperature water washing tank is used for cleaning.
[0003] The above two currently used process methods have their own disadvantages:
[0004] The first processing method is as figure 1 As shown, the first step: enter a single phosphoric acid tank with a concentration of 70%-90% for etching (the et...