Test system and its data wire number emendation method

Abstract

A test system comprises an electronic device, a microcontroller, and a test program. The electronic device at least comprises an embedded controller, a connector and a communication interface; the microcontroller is provided with a connection interface which is made up of a second signal input wire group coupled with a first signal output wire group and a second signal output wire group coupled with a first signal input wire group; and the test program is installed in the electronic device, and can transmit data to the embedded controller and the microcontroller or receive data from the embedded controller and the microcontroller. When the test system is utilized to test, the test program can control the embedded controller and the microcontroller to conduct confirmation of the arrangement mode of the second signal input wire group and the second signal output wire group. Besides, the invention provides a numeration correction method for data wire in the test system.

Description

technical field [0001] The present invention relates to a test system and a test method, and in particular to a data line number in a test system that can automatically number the input and output data lines connected to a keyboard controller and input test codes for testing. Calibration method. Background technique [0002] Before the general computer keyboard is shipped from the factory, it is necessary to test whether each key mechanism and its built-in keyboard controller (IC) work normally. The test items can be divided into electrical and mechanical tests, which include: whether the corresponding data code output from the button controller (IC) to the computer system when each button is pressed and released is correct, the mechanical properties of the button (such as sensitivity), three The operation of a light-emitting diode (LED), etc. Institutional test items require manual or mechanical operation, but the disadvantages are: a. It needs an external physical keyboa...

AI Technical Summary

Problems solved by technology

Institutional test items require manual or mechanical operation, but the disadvantages are: a. It needs an external physical keyboard, which will cause equipment consumption after long-term use; b. It requires human actual actions and tests; c. It cannot be judged Abnormal actions, such as continuous action of a single key, misoperation of the key to be tested, etc.

However, this known patent only discloses the automation of the back-end test, and does not disclose how to enable the microcontroller to automatically calibrate the number of the output / input signal lines, so there are still deficiencies

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