High-speed automatic detector of microscopic pinhole defect in chromium plate film

Abstract

A high speed automatic detector of microscopic pinhole defect in chromium film, comprising a chassis, a bench plate fixed to the chassis, wherein, a transparent glass base plate is fixed on the bench plate, two LED spot light sources are provided below the transparent glass base plate; a XY-axis robot is mounted on the bench plate, wherein, a cantilever arm and a tuning device are mounted on the Y-axis of the XY-axis robot, the two spot light sources are mounted on the cantilever, and two CCD imaging systems are provided on the top of the tuning device, and each CCD imaging system comprises 3.5-22.5X zoom lens and a CCD camera with maximum resolution >=1920*1080; the XY-axis robot is connected with a ROBOT and a PLC controller; the ROBOT and PLC controller are connected with an industrial PC through I / O, and are connected with an audible and visual alarm device and a control box on the bench plate; the cable of CCD camera is connected with a high-speed image acquisition card in the industrial PC through a tow chain, and the industrial PC is connected with a LCD display screen; a chromium plate support device is provided beside the transparent glass base plate. The apparatus in the present invention is simple in structure, easy to operate, and can detect microscopic pinhole defect in chromium plate film quickly and efficiently.

Description

technical field [0001] The invention relates to a high-speed automatic inspection instrument for pinhole microscopic defects of chromium plates. Background technique [0002] At present, the domestic inspection of pinhole microscopic defects of chrome plate film is generally carried out by using a microscope and observing with the naked eye, which is labor-intensive, poor in reliability and low in efficiency. There are special equipment for automatic inspection of pinhole microscopic defects of chromium plate film in foreign countries, which have high efficiency and reliability, realize pinholes with a precision of 2μm, and the detection time of chromium plate with a size of 650*550mm is 60min, but the structure is complicated and the volume is large (usually 2500*2000*1500mm), the price is expensive (more than RMB 15 million yuan / set). Contents of the invention [0003] The object of the present invention is to provide a high-speed automatic inspection instrument for pin...

AI Technical Summary

Problems solved by technology

[0002] At present, the domestic inspection of pinhole microscopic defects of chrome plate film is generally carried out by using a microscope to observe with the naked eye, which is labor-intensive, poor in reliability and low in efficiency.

There are special equipment for automatic inspection of pinhole microscopic defects of chromium plate film in foreign countries, which have high efficiency and reliability, realize pinholes with a precision of 2μm, and the detection time of chromium plate with a size of 650*550mm is 60min, but the structure is complicated and the volume is large (usually 2500*2000*1500mm), the price is expensive (more than RMB 15 million yuan / set)

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