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Test method and device capable of switching multi-simulation accuracy

A test method and test device technology, applied in the field of communication, can solve the problems of multi-manual intervention, difficulty in maintaining the consistency of the test environment, and low degree of automation, so as to achieve the effect of unifying the test platform and improving the degree of test automation

Active Publication Date: 2009-10-07
SANECHIPS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention aims to provide a test method and device with switchable multi-simulation precision, to solve the need to build test environments at different design stages and for different function points, it is difficult to maintain the consistency of the test environment, the degree of automation is low, and the need for more The problem of human intervention

Method used

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  • Test method and device capable of switching multi-simulation accuracy
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  • Test method and device capable of switching multi-simulation accuracy

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Experimental program
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Embodiment 1

[0051] image 3 A schematic diagram showing a workflow according to Embodiment 1 of the present invention, refer to image 3 As shown, it is a test device that can dynamically switch the simulation accuracy included in the present invention, and its specific implementation includes two parts: hardware and software. Its working principle is described as follows:

[0052] When the test device is reset and released, CPU models with different simulation precisions are guided in different ways. After the booting is completed, only one CPU / function block model is normally consistent with the ASIC design due to the configuration of the system configuration interface. For other types of function block models, only connect their input interface signals to the ASIC design, and shield the connection between the CPU / function block model output signals and the ASIC. Therefore, during the simulation process, all kinds of CPU / function block models are actually in working state, and the use...

Embodiment 2

[0062] Figure 4 A schematic diagram showing a workflow according to Embodiment 2 of the present invention, refer to Figure 4 As shown in , it is a schematic diagram of a test device for statically switching multiple precision simulation models of the present invention. When users use this device, each simulation can use a custom simulation accuracy model for simulation.

[0063] The difference between the test device in this embodiment and Embodiment 1 is that the configuration parameters input to the configuration interface have been determined before the simulation, and cannot be changed during the simulation process; the hardware part does not need the CPU field processing module to carry out field preservation and replication, During the simulation process, only one simulation accuracy model is connected and works with the ASIC design; the software part only needs to operate the configured simulation model. Others are similar to Embodiment 1.

[0064] The present inve...

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Abstract

The invention provides a test method and a device capable of switching multi-simulation accuracy. The method comprises the following steps: building a test system comprising a plurality of simulation accuracy functional block models; switching the test system into one simulation accuracy functional block model suitable for a simulation current scene in the simulation accuracy functional block models during the simulation; and executing the simulation test by using the switched simulation accuracy functional block model. The invention realizes the unification of designing a front-end test platform and a rear-end test platform of an ASIC and improves the test degree of automation.

Description

technical field [0001] The invention relates to the communication field, in particular to a test method and device with switchable multi-simulation precision. Background technique [0002] At present, SOC (System on a Chip, system chip) chip design is embedded with processor cores, such as: microprocessor or DSP (Digital Signal Processor, digital signal processor), in ASIC (Application Specific Integrated Circuit, dedicated integrated circuit In the design and verification process of circuit), different design stages will use different forms of functional block models for simulation in combination with the characteristics of the stage and the characteristics of the function points, so as to speed up the verification of chip design or enhance the simulation and actual system. Equivalence of work scenarios. Generally speaking, the main difference between these different forms of function blocks is that they have different simulation precisions, which are collectively referred...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 高海英沈梓荣
Owner SANECHIPS TECH CO LTD
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