Hardware acquisition system and method for equipment fault log

A technology for equipment failure and system acquisition, which is applied in hardware monitoring, instrumentation, electrical digital data processing, etc., can solve problems such as waste of time for engineers, inability to obtain valuable information, failure of CPU or equipment software system to respond, etc., to achieve The effect of reliable processing

Active Publication Date: 2011-12-21
NEW H3C TECH CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Obviously, if the device crashes sufficiently thoroughly that the CPU or device software system cannot respond to all signals including the NMI signal, then its software log system will not record anything until the CPU is reset; Obtain valuable information from the logs recorded by the CPU software log system, so that engineers need to waste a lot of time to reproduce and solve problems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Hardware acquisition system and method for equipment fault log
  • Hardware acquisition system and method for equipment fault log
  • Hardware acquisition system and method for equipment fault log

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] Specific embodiments of the present invention will be described in detail below. It should be noted that the embodiments described here are for illustration only, and are not intended to limit the present invention.

[0039] Based on the specification description and the consideration of easy reading, the terms appearing in the patent application documents of the present invention are defined one by one as follows:

[0040] JTAG (Joint Test Action Group, Joint Test Action Group): It is an international standard test specification that complies with the IEEE1149.1 standard. The specification that is extended on the basis of the JTAG specification is called EJTAG (Enhanced JTAG);

[0041] JTAG interface: refers to the interface defined by the JTAG specification, such as the existing JTAG interface or EJTAG interface, or even some private interfaces defined based on the JTAG specification;

[0042] It should be noted that the above terms are only used to refer to one of t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a hardware acquisition system and method for equipment failure logs. The logic device is connected with the watchdog device and the JTAG interface of the CPU respectively, and is used to receive the trigger when the watchdog device times out and overflows, and performs boundary scan on the selected unit in the CPU through the JTAG interface according to the preset boundary scan logic, and according to The obtained boundary scan results generate a device failure log; and trigger a CPU reset after the boundary scan ends. The present invention is not limited to the fault degree of the device software, and can still ensure the acquisition of key information of the device even in the case of a deep fault of the device software system.

Description

technical field [0001] The invention relates to the technical field of electronic equipment, in particular to a hardware acquisition system for equipment failure logs and a hardware acquisition method for equipment failure logs. Background technique [0002] With the continuous development and progress of electronic technology, the function of electronic equipment is becoming more and more powerful, and its structure is correspondingly more and more complex, which puts forward higher requirements for the reliability and maintainability of electronic equipment. Wherein, fault location and fault cause finding in the electronic device depend on the log information recorded by the electronic device itself. [0003] At present, it is generally combined with watchdog technology to record device fault logs based on software. Its working principle is as follows: figure 1 Shown: [0004] When the central processing unit (CPU) is in the normal working state, it will schedule the equ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/34G06F11/00
Inventor 张元
Owner NEW H3C TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap