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Circuit test device

A circuit testing and testing technology, applied in the direction of digital circuit testing, electronic circuit testing, etc., can solve the problem of high price of Class D amplifier IC

Inactive Publication Date: 2011-09-28
PRINCETON TECH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, the price of a dedicated tester for Class D amplifier ICs is very expensive. Therefore, on the premise of effectively saving the test cost of Class D amplifier ICs, how to use existing digital logic testers to achieve the purpose of accurately testing Class D amplifier ICs. Become one of the goals and topics of general digital logic testing machine research and development

Method used

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Embodiment Construction

[0034] see figure 2 , figure 2 It is a schematic diagram of an embodiment of testing a DUT by the circuit testing device of the present invention. Such as figure 2As shown, the circuit testing device 20 of the present invention is used to test a component 21 to be tested. In one embodiment, the circuit testing device 20 of the present invention is a logic tester, and the component 21 to be tested can be an integrated Circuit (Integrated Circuit, IC).

[0035] The circuit testing device 20 includes a microprocessor 22 , a measurement module 24 and an operation module 26 . The microprocessor 22 is used to provide a test signal S T To the device under test 21, the device under test 21 receives the test signal S T After that, generate at least one measurement signal S 1 , and according to at least one signal measurement result S R To determine the test result of the DUT 21. The measurement module 24 is coupled to the DUT 21 for measuring the at least one measurement sig...

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Abstract

The invention discloses a circuit test device for testing an element to be tested, comprising a microprocessor, a measuring module and an operation module, wherein the microprocessor is used for providing a test signal to the element to be tested, the element to be tested generates at least one measuring signal after receiving the test signal, and the test result of the element to be tested is determined by at least one signal measuring result; the measuring module is coupled with the element to be tested and used for measuring the measuring signal to generate at least one voltage measuring result and at least one period measuring result; and the operation module is coupled with the measuring module and used for previously operating the voltage measuring results and the period measuring results to generate the signal measuring result. The circuit test device can increase the test speed and greatly reduce the test cost.

Description

technical field [0001] The invention provides a circuit testing device, especially a circuit testing device capable of measuring the gain and voltage offset of a component to be tested. Background technique [0002] With the advancement of technology, the functions of integrated circuits (Integrated Circuit, IC) are becoming more and more powerful, and their importance is also increasing day by day. In order to ensure the quality of the IC when it is shipped, after the completion of the manufacturing process, each IC is generally tested. The manufacturer will determine whether the IC is qualified based on the test results of the IC, and then judge whether the IC can be used. supply to downstream manufacturers. [0003] Taking today's common IC mass production testing method as an example, a logic tester is generally used as a testing tool for ICs before they leave the factory. According to the IC with different functions, it has its dedicated testing machine. figure 1 is ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R31/317
Inventor 滕贞勇许丽娇
Owner PRINCETON TECH CORP