Analog and digital mixed signal chip test card

Abstract

The invention discloses an analog and digital mixed signal chip test card. A chip test circuit on the test card comprises a system interface module, a configuration chip, an FPGA processing module and a digital-to-analog conversion module; the system interface module is connected with the FPGA processing module through a bus; the FPGA processing module connected with the configuration chip is connected with an input end of the digital-to-analog conversion module through a digital signal output end, and is connected with a tested chip carrier through a control end; an output end of the digital-to-analog conversion module is connected with an analog signal input end of the tested chip carrier; and a digital signal output end of the tested chip carrier is connected with a digital signal input end of the FPGA processing module. The chip test card has reasonable design, has the characteristics of steady performance, quick test speed, high efficiency, flexible and convenient use and the like, and meets the test need of analog and digital mixed signal chips; in addition, the chip test card can also be matched with other types of test cards or functional boards so as to realize the test need of different types of chips.

Description

technical field [0001] The invention belongs to the field of integrated circuit chip testing, in particular to an analog-digital mixed-signal chip test card. Background technique [0002] After designing and producing integrated circuit chips, integrated circuit design and manufacturers usually need to use a dedicated chip testing machine to test the integrated circuit chips to identify bad chips and mark them, so as to create conditions for the subsequent production process. Only by passing the test Integrated circuit chips can only be sold out of the factory, and integrated circuit chips that have not passed the test cannot be shipped. At present, domestic integrated circuit chip testing is mainly performed by integrated circuit chip manufacturers themselves and entrusted by professional test manufacturers to test. Due to the current lack of testing capabilities of domestic chip manufacturers and the scarcity of professional testing manufacturers, chip testing has become ...

AI Technical Summary

Problems solved by technology

Existing chip testing machines are usually only able to test single-type signal integrated circuit chips, but cannot effectively test mixed-signal chips, and the test cost is expensive

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