Analog and digital mixed signal chip test card

A technology of analog-digital mixing and chip testing, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of inability to mix signal chip testing and high testing costs, and achieve low testing costs, fast testing speeds, and reduced costs Effect

Active Publication Date: 2009-12-02
天津津能易安泰科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing chip testing machines are usually only able to test single-type signal integrate...

Method used

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  • Analog and digital mixed signal chip test card
  • Analog and digital mixed signal chip test card
  • Analog and digital mixed signal chip test card

Examples

Experimental program
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Embodiment Construction

[0024] Embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings.

[0025] An analog-digital mixed-signal chip test card is composed of a test card connected with a chip carrier board to be tested. The chip to be tested is inserted into a chip socket on the chip carrier board to be tested. The chip test card can be inserted into the G5000 testing machine. It can also be installed in the card slot of other general testing equipment. The chip test card is equipped with a chip test circuit, such as figure 1 As shown, the chip test circuit includes a system interface module, a configuration chip, an FPGA processing module and a digital-to-analog conversion module. The system interface module is connected to the FPGA processing module through a data bus, a control bus and an address bus; The processing module is connected to the input end of the digital-to-analog conversion module through the digital signal output ...

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Abstract

The invention discloses an analog and digital mixed signal chip test card. A chip test circuit on the test card comprises a system interface module, a configuration chip, an FPGA processing module and a digital-to-analog conversion module; the system interface module is connected with the FPGA processing module through a bus; the FPGA processing module connected with the configuration chip is connected with an input end of the digital-to-analog conversion module through a digital signal output end, and is connected with a tested chip carrier through a control end; an output end of the digital-to-analog conversion module is connected with an analog signal input end of the tested chip carrier; and a digital signal output end of the tested chip carrier is connected with a digital signal input end of the FPGA processing module. The chip test card has reasonable design, has the characteristics of steady performance, quick test speed, high efficiency, flexible and convenient use and the like, and meets the test need of analog and digital mixed signal chips; in addition, the chip test card can also be matched with other types of test cards or functional boards so as to realize the test need of different types of chips.

Description

technical field [0001] The invention belongs to the field of integrated circuit chip testing, in particular to an analog-digital mixed-signal chip test card. Background technique [0002] After designing and producing integrated circuit chips, integrated circuit design and manufacturers usually need to use a dedicated chip testing machine to test the integrated circuit chips to identify bad chips and mark them, so as to create conditions for the subsequent production process. Only by passing the test Integrated circuit chips can only be sold out of the factory, and integrated circuit chips that have not passed the test cannot be shipped. At present, domestic integrated circuit chip testing is mainly performed by integrated circuit chip manufacturers themselves and entrusted by professional test manufacturers to test. Due to the current lack of testing capabilities of domestic chip manufacturers and the scarcity of professional testing manufacturers, chip testing has become ...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R31/3167
Inventor 刘华赵春莲姚琳张超华锡培
Owner 天津津能易安泰科技有限公司
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