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Interface testing method and device

A technology of interface testing and interface, which is applied in the direction of error detection/prevention using signal quality detectors, digital transmission systems, electrical components, etc. It can solve the problems of complex testing, inability to test Ethernet interface functions, and long testing time. short time effect

Active Publication Date: 2009-12-02
ZTE CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The system and method cannot enable the Ethernet interface to forward and receive data streams at wire speed, and therefore cannot perform a comprehensive functional test on the Ethernet interface
Moreover, this test method takes a long time to test and is complicated to test, making it difficult to realize single-board functional testing in the production line.

Method used

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  • Interface testing method and device

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Embodiment Construction

[0019] A method and device for interface testing proposed in this paper can form a loopback at the interface under test. It only needs to send a broadcast packet data message inside the board, and then use the principle of broadcast storm to make the interface run at line speed. Form the wire-speed data flow by itself, no external test equipment is needed, so as to achieve the purpose of functional testing of the interface.

[0020] In this embodiment, in order to test more quickly and interface positioning more accurately, a testing method and device based on a Virtual Local Area Network (Virtual Local Area Network, VLAN) interface are described

[0021] In this embodiment, the Ethernet interface is taken as an example, and the present invention will be further described in detail with reference to the accompanying drawings.

[0022] figure 1 Shown is a schematic diagram of the structure of the Ethernet interface test device. The Ethernet interface function testing device i...

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Abstract

The invention relates to an interface testing method and an interface testing device. The method comprises the following steps: forming a loop at an interface; sending broadcast data packets to the interface to form broadcast storm to make the interface in a linear speed state; and measuring multiple kinds of data of the interface. Because the loop is formed at the interface, and the multiple kinds of data is measured under the linear speed condition based on VLAN, the comprehensive testing for the interface is short in time, simple and convenient.

Description

technical field [0001] The invention relates to an interface testing method and device, in particular to an Ethernet interface testing method and device. Background technique [0002] Board interface function test is a test method used in the board production process to ensure the welding quality of board production. The test method is characterized by convenient testing, short test time, and automatic testing. In router or switch products, there will be many Ethernet interfaces connected to the outside world. The test of the Ethernet interface is mainly to test various transceiver signal lines and clock lines, and the transceiver signal lines and clock signal lines of most Ethernet interfaces are differential signal lines, in order to test the various signal lines of the Ethernet interface A comprehensive functional test requires the Ethernet interface to forward and receive data streams at wire speed. So many Ethernet interfaces need to transmit and receive data streams ...

Claims

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Application Information

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IPC IPC(8): H04L1/20H04L12/26
Inventor 梁志强周嵘郝磷徐东峰
Owner ZTE CORP
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