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Method and device for supporting sample of pulse excitation method elasticity modulus tester

A technology of elastic modulus and pulse excitation, which is used in measuring devices, instruments, scientific instruments, etc., can solve the problems of needing to replace supporting devices and complicated operations, and achieve the effects of simple operation, avoiding cumbersome operations, and improving detection efficiency.

Active Publication Date: 2010-04-21
SINOSTEEL LUOYANG INST OF REFRACTORIES RES
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to provide a sample support method and device of a pulse excitation method elastic modulus tester, which is to overcome the shortcomings of the prior art that the support device must be replaced and the operation is cumbersome when measuring two parameters of the same sample. Can be used at room temperature or high temperature conditions

Method used

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  • Method and device for supporting sample of pulse excitation method elasticity modulus tester
  • Method and device for supporting sample of pulse excitation method elasticity modulus tester
  • Method and device for supporting sample of pulse excitation method elasticity modulus tester

Examples

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Embodiment 1

[0022] attached figure 1 It is a schematic structural diagram of the relative position of the sample support device in Example 1 and the sample. The sample support device for the pulse excitation method elastic modulus tester includes three support columns, which are arranged on the same plane and can be fixed on a flat plate as required. One side is the A support column 21, which corresponds to the A support point, and the other side is the B support column 33 and the C support column 34, which correspond to the support points 31 and 32 in the lower part of the sample respectively; The top of the column is spherical and the bottom is flat, and the tops of the three supporting columns correspond to the supporting points on the lower part of the specimen. The material of the support column is a hard material, which can be a hard alloy or a high temperature resistant ceramic. The top of the column is in point contact with the bottom surface of the sample. The distance between...

Embodiment 2

[0024] attached figure 2 It is a schematic structural diagram of the relative position of the sample support device in Example 2 and the sample.

[0025] The support device includes two left and right support tubes 81, 82 and a base 9. The right support tube 81 and the left support tube 82 are respectively arranged on both sides of the base 9, and a wire is wrapped around the right support tube. 71. Surround two wires 72 on the left support tube 82, the two wires 72 on the left support tube 82 correspond to the B and C support points of the sample, and the metal wires on the right support tube correspond to the A support point. The distance between the two metal wires on the left and the contact point of the bottom of the sample is 2 / 3 of the length of the short line 5 of the sample on the left.

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Abstract

The invention discloses a method for supporting a sample of a pulse excitation method elasticity modulus tester. In the method, three supporting points are arranged below the sample, a supporting device is arranged on the lower parts of the supporting points, and the supporting device is in point contact with the supporting points; and the positions of the three supporting points are that a supporting point A is arranged on one side from the length direction of the sample, two supporting points B and C are arranged at one end on the other side from the length direction of the sample, and the supporting point A and the supporting points B and C can be interchanged on two sides of the length direction of the sample. The supporting device can also comprise a left supporting pipe (81), a right supporting pipe (82), a base (9) and metal wires (71 and 72) arranged on the two supporting pipes. The method and the device have the following advantages that: through the three-point type supporting below the sample, at the room temperature or a high temperature, a young modulus (E) and a shear modulus (G) can be measured synchronously in a same supporting mode, the difficulty that the young modulus and the shear modulus are difficult to be tested synchronously at a high temperature is solved, the supporting device is unnecessary to be changed in the test process, the operation is simple and convenient, the possible errors caused by complicated operations are avoided, and the efficiency is improved.

Description

technical field [0001] The invention relates to a test instrument for testing the elastic modulus of solid materials at room temperature or high temperature, in particular to a sample support method and device for a pulse excitation method elastic modulus tester. Background technique [0002] Refractory materials and other inorganic non-metallic materials are deformed when they are subjected to external forces within their elastic limits. [0003] After removal, it can still return to its original shape, and the ratio of stress and strain at this time is called its elastic modulus. The elastic modulus generally includes Young's modulus (E, also known as flexural modulus), shear modulus (G). The method for measuring the elastic modulus of refractory materials is generally divided into static method (mainly static load method) and dynamic method (mainly resonance method). The elastic modulus of the material can be measured quickly and accurately without damage to the materia...

Claims

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Application Information

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IPC IPC(8): G01N29/22
Inventor 娄海琴李永刚谭丽华乔爱军邵昕李晓睿
Owner SINOSTEEL LUOYANG INST OF REFRACTORIES RES