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Automatic test system for integrated circuit board electrodes

An automatic test system and integrated circuit technology, applied in electronic circuit testing, sorting and other directions, can solve the problems that the USB port test device does not have the ability to test integrated circuit chips, cannot meet the testing needs of integrated circuit chips, etc., and achieves efficient parallel testing. ability, balance design and test resources, and the effect of shortening test time

Inactive Publication Date: 2010-06-23
BEIJING CHIPADVANCED
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Problems solved by technology

[0005] However, the above-mentioned USB port testing device does not have the ability to test integrated circuit chips, so it cannot meet the testing needs of integrated circuit chips with USB interfaces.

Method used

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  • Automatic test system for integrated circuit board electrodes
  • Automatic test system for integrated circuit board electrodes
  • Automatic test system for integrated circuit board electrodes

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Embodiment Construction

[0016] see figure 1 As shown, the integrated circuit board-level automatic test system provided by the present invention includes a computer, a GPIB interface, a USB interface, an automatic sorter (HANDLER) and a test interface board. Wherein, the computer is connected to the GPIB interface and the USB interface, and the GPIB interface is connected to the automatic sorting machine (HANDLER). Both the automatic handler (HANDLER) and the USB interface are connected to a test interface board, and the test interface board is connected to a device under test (DUT for short).

[0017] In this integrated circuit board-level automatic test system, the computer used can be an ordinary PC or an MCU (microcontroller) with relatively high computing power. The used automatic sorter (HANDLER) is preferably EPSON NS-6040HANDLER. This is a mixed-signal automatic sorting machine with single-channel / dual-channel / multi-channel test mode, which can perform high-speed testing of integrated circu...

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Abstract

The invention discloses an automatic test system for integrated circuit board electrodes, which comprises a computer, a GPIB interface, a USB interface, an automatic separating machine and a test interface board, wherein the computer is connected with the GPIB interface and the USB interface, the GPIB interface is connected with the automatic separating machine, both the automatic separating machine and the USB interface are connected with the test interface board which is connected with tested devices. The automatic test system for integrated circuit board electrodes has the characteristics of convenient use, low cost, high automatic degree and the like, includes efficient parallel testing ability simultaneously, and shortens testing time by effectually balancing the resources for design and test, thereby offering a more effective test solution to users.

Description

technical field [0001] The invention relates to an integrated circuit testing system, in particular to a board-level automatic testing system for integrated circuit chips with a USB interface, which belongs to the technical field of integrated circuit testing. Background technique [0002] In the integrated circuit manufacturing process, testing is one of the key means to ensure the performance and quality of integrated circuits. In recent years, with the continuous increase of integrated circuit design scale, the continuous improvement of design methods, and the widespread adoption of high-density process technology, the integrated circuits produced today are small in size and powerful in function. It has also raised an unprecedented challenge - how can manufacturers test these integrated circuit chips efficiently and cheaply. [0003] At present, the method for testing integrated circuits is usually to use automatic test equipment (Automatic Test Equipment, ATE for short)...

Claims

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Application Information

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IPC IPC(8): G01R31/28B07C5/344
Inventor 张琳刘炜石志刚吉国凡王慧金兰宋奕霖
Owner BEIJING CHIPADVANCED
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