Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Test device simulating a plurality of memories and test method thereof

A storage device and test device technology, applied in error detection/correction, instrumentation, electrical digital data processing, etc., can solve problems such as increased test cost, magnetic track damage, hard disk damage, etc., to reduce production test cost, fast test speed, The effect of fast reading and writing speed

Inactive Publication Date: 2010-06-23
PEGATRON +1
View PDF0 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example: (1) During the test, the connector of the SATA hard disk is easily damaged due to frequent plugging and wear, and a new SATA hard disk must be replaced, which will greatly increase the test cost
(2) In the process of moving and plugging, the SATA hard disk is easily damaged due to collision
(3) The SATA physical hard disk is a magnetic medium. If it is suddenly powered off or placed in a strong magnetic field, it will easily cause damage to the magnetic track, and it is not easy to repair
(4) When testing, as many SATA connectors as there are on the motherboard, how many physical hard disks are needed, and each physical hard disk will occupy a certain space, so if the motherboard has multiple SATA connectors, it will make the test A large space is required for testing, and multiple SATA hard disks need to be purchased, which increases the cost of testing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test device simulating a plurality of memories and test method thereof
  • Test device simulating a plurality of memories and test method thereof
  • Test device simulating a plurality of memories and test method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] figure 2 Shown is a schematic diagram of a test setup for a preferred embodiment of the invention.

[0015] The testing device 200 provided in this embodiment is used for testing a plurality of first storage device connectors 302a, 302b of the motherboard 301 of the computer device 300 . Theoretically, during testing, the plurality of first storage device connectors 302a, 302b should be connected to a plurality of corresponding storage devices. In this embodiment, the storage device is a hard disk, preferably, the storage device is a SATA hard disk, but the present invention is not limited thereto. In this embodiment, the above-mentioned first storage device connectors 302a, 302b are SATA hard disk connectors, suitable for connecting with SATA hard disks. The SATA signal sent by the motherboard 301 can be transmitted to the SATA hard disk connected to the SATA hard disk connector through the SATA hard disk connector.

[0016] In this embodiment, in addition to being...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a test device simulating a plurality of memories and a test method thereof, which are used for testing a plurality of first memory connectors of a computer. Multiple first access commands are sent out by the computer to the test device through the first memory connectors so as to simulate the access operation for multiple access zones in the memories. The test device comprises a control unit and a test access zone. The control unit is coupled with the test access zone, and the first access commands are received by the control unit. The test access zone is used for simulating the access zones, and the control unit makes responses to the first access commands, and carries out the access operation of the first access commands for the test access zone. In the present invention, one access zone is arranged in a computer memory. The computer memory, different from the hard disk drive, has the characteristics of high reading-writing speed, so the test speed is high. Compared with the hard disk drive, the computer memory also has the advantages of small volume, good vibration resistance and little possibility of damage, so the production and test cost can be reduced.

Description

technical field [0001] The invention relates to a test device, and in particular to a test device for simulating multiple storage devices and a test method thereof. Background technique [0002] In the production process of the motherboard of the computer device, in order to test whether the function of the Serial Advanced Technology Attachment (SATA) hard disk connector of the motherboard is normal, many equipment and consumables are used to test the SATA hard disk connector of the motherboard . [0003] like figure 1 As shown, the motherboard 101 is provided with four SATA hard disk connectors 102a-102d. When testing the SATA hard disk connectors 102 a - 102 d , it is necessary to connect four SATA hard disks 103 a - 103 d to the SATA hard disk connectors 102 a - 102 d of the motherboard 101 . [0004] Of course, the motherboard 101 is also connected with necessary components for testing, such as CPU, memory, hard disk and other components necessary for running the test...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/267
Inventor 胡建明马志东许彬尹国煌
Owner PEGATRON
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products