Test device simulating a plurality of memories and test method thereof
A storage device and test device technology, applied in error detection/correction, instrumentation, electrical digital data processing, etc., can solve problems such as increased test cost, magnetic track damage, hard disk damage, etc., to reduce production test cost, fast test speed, The effect of fast reading and writing speed
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[0014] figure 2 Shown is a schematic diagram of a test setup for a preferred embodiment of the invention.
[0015] The testing device 200 provided in this embodiment is used for testing a plurality of first storage device connectors 302a, 302b of the motherboard 301 of the computer device 300 . Theoretically, during testing, the plurality of first storage device connectors 302a, 302b should be connected to a plurality of corresponding storage devices. In this embodiment, the storage device is a hard disk, preferably, the storage device is a SATA hard disk, but the present invention is not limited thereto. In this embodiment, the above-mentioned first storage device connectors 302a, 302b are SATA hard disk connectors, suitable for connecting with SATA hard disks. The SATA signal sent by the motherboard 301 can be transmitted to the SATA hard disk connected to the SATA hard disk connector through the SATA hard disk connector.
[0016] In this embodiment, in addition to being...
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