Floating body cell structure of dynamic random access memory and manufacturing technology thereof
一种存储器单元、动态随机的技术,应用在静态存储器、半导体/固态器件制造、数字存储器信息等方向,能够解决漏电流特性难控制等问题,达到降低漏电流、提高器件可靠性、制造成本低廉的效果
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[0059] The device structure of the present invention will be further described below in conjunction with the accompanying drawings, which are not drawn to scale for the convenience of illustration.
[0060] Such as Figure 4 As shown, a cell structure of a high-efficiency, low-power, and highly integrated gate diode floating body DRAM based on the band-to-band tunnel penetration effect, which includes: a buried oxide layer (BOX) 100, located in the buried oxide layer The first P-type semiconductor region 201 on the 100, the N-type semiconductor region 203 positioned on the first P-type semiconductor region 201 and the gate region positioned on the N-type semiconductor region 203; one side of the N-type semiconductor region 203 is provided with The second P-type semiconductor region 202, and the second P-type semiconductor region 202 communicates with the first P-type semiconductor region 201; A shallow trench isolation region 300 is arranged around the active region of the ac...
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