Infrared focal plane non-uniformity fingerprint extraction and image correction method

An infrared focal plane and non-uniformity technology, applied in the field of infrared imaging, can solve the problems of inconvenient hardware implementation, cumbersome calibration process, and long time consumption

Active Publication Date: 2010-07-14
HUAZHONG UNIV OF SCI & TECH
View PDF0 Cites 21 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Some conventional algorithms are complicated and time-consuming; some need to use a uniform baffle to obtain background frames every time they are calibrated, and the calibration process is cumbersome; although some algorithms take into account the law that the detector itself changes with the ambient temperature, it needs to record a large number of data, not convenient for hardware implementation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Infrared focal plane non-uniformity fingerprint extraction and image correction method
  • Infrared focal plane non-uniformity fingerprint extraction and image correction method
  • Infrared focal plane non-uniformity fingerprint extraction and image correction method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0078] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments, wherein the actual specification of the infrared focal plane array used is R×C=288×384.

[0079] (1) Fingerprint extraction and storage step: Utilize described infrared focal plane nonuniformity fingerprint extraction method to extract the nonuniformity fingerprint of detector infrared focal plane,

[0080] (1.1) The data acquisition step of described non-uniformity fingerprint extraction method:

[0081] First let the surface source blackbody temperature T b constant at 40 degrees;

[0082] Secondly, make the focal plane work at an ambient temperature of T SL = In the incubator at -40°C, a total of FrmNumber = 36 frames of black body images were collected from the start of the detector until the work was stable for a period of time;

[0083] Then let the ambient temperature increase by ΔT S = 10 degrees, so that the focal plane works at ΔT...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to an infrared focal plane non-uniformity fingerprint extraction and image correction method which belongs to the technical field of infrared imaging. A production process decides, each infrared focal plane is provided with a relatively stable non-uniformity mode and a rule thereof which varies with temperature, and the two are collectively called fingerprints. The invention provides the definitions of non-conformity fingerprints, analyzes the characteristics of the focal plane non-uniformity in a frequency domain by wavelet decomposition, extracts the non-uniformity fingerprints which belong to the focal plane, and then stores the fingerprints in a storage unit of a detector. When in correction, with the environment temperature as the input parameter, the method can carry out non-uniformity correction under the constraint of the fingerprints after reading the non-uniformity fingerprints at the environment temperature. Compared with convention methods, the method does not need to obtain a background frame with a uniform baffle in every time of correction and has simple correction idea, thereby simplifying the correction device and the correction process, and the image non-uniformity after correction is significantly improved.

Description

technical field [0001] The invention belongs to the technical field of infrared imaging, and in particular relates to an infrared focal plane non-uniformity correction method. Background technique [0002] Infrared focal plane array (IPFPA) technology has become the main direction of infrared imaging technology development. Compared with the linear scan imaging method, the focal plane array element has high sensitivity, can obtain more surface information about the object, and has a higher and variable frame rate, and is rapidly becoming the mainstream device of infrared imaging technology. In addition to being widely used in the military, it has also developed rapidly in civilian fields such as night vision, maritime rescue and search, astronomy, industrial heat detection, and medicine. [0003] However, due to the influence of the manufacturing process and the use environment, the non-uniformity of the image becomes the limiting factor restricting the performance of the i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/52H04N5/33
Inventor 张天序杨超张春晓桑红石颜露新袁雅婧刘慧娜施长城
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products