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Audio performance testing method and device

A test device, audio signal technology, applied in the direction of monitoring/monitoring/test arrangement, telephone communication, electrical components, etc., can solve the problems of not reflecting the load change of the audio circuit, the conversion rate is steep, the performance cannot meet the requirements, etc., and achieve saving Effect of Acoustic Setup and Test Time

Inactive Publication Date: 2010-07-28
ALCATEL LUCENT SHANGHAI BELL CO LTD
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  • Application Information

AI Technical Summary

Problems solved by technology

However, this programming electronic loading device has the following two disadvantages: on the one hand, the step change is discrete, while the actual audio signal is continuous, so it cannot reflect the actual load change in the audio circuit; on the other hand, the slew rate (slewrate) is very steep from point to point, while the actual audio signal changes smoothly
On the other hand, new equipment replacing the current equipment may pass the test when it is qualified, but may not perform as required when further acoustic testing is performed

Method used

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  • Audio performance testing method and device
  • Audio performance testing method and device
  • Audio performance testing method and device

Examples

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Embodiment approach

[0031] Figure 6 A schematic circuit diagram of an example loading device according to another embodiment of the invention is shown. As shown in the figure, the loading device 40AB includes a memory 403 storing standard voice data, a codec 401B, and a differential amplifier 402B. The codec 401B includes data processing, amplification and filtering functions, and processes the standard voice data from the memory 403 to generate a differential voice signal reflecting the actual dynamic load. The differential voice signal from the codec 401B is input to the subsequent circuit through the differential amplifier 402B. Such loading devices are especially useful in certain applications. For example, it is common to have both receiving and articulating features in the same product. Therefore, in this embodiment, the audio system of the product itself can be used to form the above-mentioned waveform generator.

[0032] The loading devices described above are only examples. Those s...

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Abstract

The invention discloses an audio performance testing method and a device. Particularly, the invention is used for testing an audio system which comprises a power supply, an audio signal generating device and an audio processing circuit. The audio signal generating device powered by the power supply is used for generating audio signals according to voices, and the audio processing circuit coupled to the audio signal generating device is used for processing the audio signals. In the method of the invention, a load changed in continuous and gradually-changed waveforms is provided to substitute the audio signal generating device to be coupled to the audio processing circuit in order to test the system. The invention can accurately test the audio performance, particularly the impact on the audio performance by transient response of the power supply.

Description

technical field [0001] The present application relates to the field of audio testing, and in particular relates to a method and device for testing audio performance, especially the influence of power load transient response on audio performance. Background technique [0002] Currently, audio systems are widely used in various applications, for example, various telephone devices. Typically, audio distortion measurement equipment is used to evaluate the performance of an audio system. When evaluating, audio quality or performance is often judged by measuring acoustic parameters such as total harmonic distortion (THD), dynamic range, crosstalk, and the like. Of course, various techniques or devices exist to evaluate audio systems. For example, when measuring THD, the THD magnitude can be estimated by passing through an acoustic room using harmonic devices in the 20-20kHz range. However, the THD thus measured is a system-level or subsystem-level THD. Generally, an audio syst...

Claims

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Application Information

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IPC IPC(8): H04M1/24H04M3/22
Inventor 郑伯诺
Owner ALCATEL LUCENT SHANGHAI BELL CO LTD