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Method for calibrating imaging position of point on optical axis on CCD

A technology of imaging position and optical axis, which is applied in the directions of measuring devices, instruments, surveying and navigation, etc., can solve the problems of error and high operation requirements, and achieve the effect of strong practicability, high calibration accuracy, simple principle and operation

Inactive Publication Date: 2012-06-13
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

Furthermore, this method is to eliminate the error and determine the zero position through two measurements of the front and back mirrors, which theoretically requires that the conditions of the front and back mirror measurements of the optical system are exactly the same, and a slight difference will bring error, so this measurement method has relatively high requirements for operation

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  • Method for calibrating imaging position of point on optical axis on CCD
  • Method for calibrating imaging position of point on optical axis on CCD
  • Method for calibrating imaging position of point on optical axis on CCD

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Embodiment Construction

[0015] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0016] Such as figure 1 As shown, the experimental equipment required in this example includes: marble platform, optical measurement system, and target frame, wherein the focal length of the optical system in the optical measurement system is f=30mm, the center distance between the two targets in the target frame is 1000mm, and the two target points are A, B, the image formed on the CCD is a, b, the length of the line segment AB is L, it is known that L=1000mm, the length of the line segment a, b is l, and the distance of l can be calculated by the value of a and b Obtained, regarded as a known quantity, the distance from the optical node O to the center point of the target rack is R. Schematic diagram of optical imaging such as figure 2 as shown, When the position of the optical measurement system on the platform is 1, the relationship bet...

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Abstract

The invention relates to a method for calibrating the imaging position of a point on an optical axis on a CCD, which belongs to the technical field of photoelectric measurement. The method comprises the following steps: placing an optical measuring system on a platform with a guide rail, leveling the platform, the measuring system and a target frame, and fixing the target frame; respectively electrifying the target frame and the measuring system, and setting the imaging position of the point on the optical axis on the CCD to be W; moving the measuring system to a position 1 of the platform, and controlling the measuring system to measure the target frame to obtain a measured Z value of Z1, wherein the Z is the height difference of midpoints of two target point connecting line on the optical axis of the measuring system and the target frame; moving the measuring system to a position 2 of the platform, and controlling the measuring system to measure the target frame to obtain the measured Z value of Z2; and comparing the Z1 with the Z2, and if the Z1 and the Z2 are unequal, resetting the position of the W, then repeatedly measuring the Z1 and the Z2 until the Z1 is equal to the Z2, wherein the position of the W at the moment is the imaging position of the point on the optical axis on the CCD. The invention has simple operation, strong practicability and high calibration precision.

Description

technical field [0001] The invention belongs to the technical field of photoelectric measurement and relates to a method for calibrating the imaging position of a point on an optical axis on a CCD. Background technique [0002] Photoelectric measurement method is the most widely used precision measurement method at this stage, and is widely used in national defense construction such as aerospace, navigation, satellite surveying and mapping, industrial manufacturing and daily life. With the wide application of photoelectric measurement methods, the required measurement accuracy is getting higher and higher, and the measurement subjects are also increasing. In many measurements, it is necessary to demarcate the imaging position of the point on the optical axis on the CCD so that it can be used as the measurement zero position in the measurement. In the previous equipment, the zero position of the calibration CCD was generally calibrated with a large-diameter collimator. Use ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01C11/00
Inventor 李建荣王志乾赵雁刘畅沈铖武耿天文刘绍锦
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI