Synchronous dynamic tester capable of cascading with great amount of channels

Abstract

The invention discloses a dynamic tester capable of cascading with a great amount of channels, comprising a master station and slave stations, wherein, the slave stations are configured through master station software to form a large scale tester; data acquisition and transmission of each slave station are independently realized under the control of the synchronous signals of the master station; a 16-channel slave station is formed by a 16-channel basic terminal and a computer; the mater station is formed by a synchronous control unit and a computer; the slave station is connected with the mater station through a synchronous interface; and the synchronous control of a plurality of the slave stations is finished through a synchronous control unit in the mater station and an application program in the computer by the slave station, thus dynamic data acquisition of an arbitrary channel is realized. In the invention, the synchronous dynamic tester capable of cascading with a great amount of channels is formed in a cascading manner; the synchronous control unit realizes the simultaneity of data acquisition, and strictly synchronizes among channels, thus improving work efficiency, reliability and expandability of the tester.

Description

technical field [0001] The invention relates to the technical field of dynamic testing, in particular to a synchronous dynamic testing instrument with a large number of cascadable channels of a large-scale testing system. Background technique [0002] In most dynamic test and analysis systems, the sampling of multiple sensor signals from the object under test requires strict synchronization in order to extract relevant information. The traditional synchronization method is completed by using a sample / hold circuit, but when the sampling frequency is different, the sample / hold time will change accordingly. When the number of channels reaches more than 32 channels, due to the large amount of data, it is difficult to rely on one acquisition device to achieve , hundreds or even thousands of channels are often required in large-scale dynamic test projects, and it is difficult for existing sample / hold circuits to realize synchronous dynamic tests in large-scale dynamic test project...

AI Technical Summary

Problems solved by technology

The traditional synchronization method is completed by using a sample / hold circuit, but when the sampling frequency is different, the sample / hold time will change accordingly. When the number of channels reaches more than 32 channels, due to the large amount of data, it is difficult to rely on one acquisition device to achieve , hundreds or even thousands of channels are often required in large-scale dynamic test projects, and the existing sample / hold circuits are difficult to achieve synchronous dynamic testing in large-scale dynamic test projects

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