Visual inspection method for chip electronic component position error based on edge fitting
An electronic component and edge fitting technology, applied in the field of image processing, can solve the problems of slow detection speed, poor accuracy, and reduced efficiency, and achieve the effect of fast calculation speed
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[0014] In the present invention, a general-purpose camera is first used to obtain a grayscale image of a chip electronic component, the image is preprocessed, and binarization is performed through threshold segmentation. After the binarization, the following is obtained: figure 2 image to isolate the target region. then to figure 2 The image after binary processing shown in the figure is subjected to edge detection and contour extraction at the same time. image 3 The edge contour of the image of the chip electronic component is shown, and then the boundary contour point set Ω of the entire image is obtained by boundary tracking, and the edge point chain structure of the image is generated.
[0015] Such as Figure 4 As shown, according to the obtained edge point chain structure, the center O(x c ,y c ) for preliminary calculation, the center coordinates of the contour (x c ,y c ) is calculated using the following contour center of gravity formula:
[0016] ...
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