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Low-laser loss parameter comprehensive measurement device for high reflector

A high-reflection mirror and comprehensive measurement technology, applied in the direction of testing optical properties, can solve the problems that have not yet been found in closely related or identical reports and documents, and achieve the effects of reducing measurement costs, enhancing measurement functions, and flexible design

Inactive Publication Date: 2010-09-22
XIAN TECH UNIV
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Problems solved by technology

The project team of this invention has searched domestic and foreign patent documents and published journal papers, and has not found any reports and documents closely related to or identical to the present invention

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  • Low-laser loss parameter comprehensive measurement device for high reflector
  • Low-laser loss parameter comprehensive measurement device for high reflector

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Embodiment Construction

[0026] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0027] see figure 1 , a high reflection mirror laser low-loss parameter comprehensive measurement device, including a light source assembly arranged on an optical platform 24, an integrating sphere 15, a transmission measurement assembly A, an integral scattering measurement assembly B and a backscattering measurement assembly C, on the integrating sphere 15 A photomultiplier tube 20 is arranged on it.

[0028] An adjustable optical path deflection device is arranged between the transmission measurement component A and the integrating sphere 15 , and in this embodiment the optical path deflection device includes a movable third reflector 11 and a fourth reflector 12 that are arranged oppositely.

[0029] The light source component is a conventional component with a wave plate 4 and an attenuation plate 6, as long as it can provide the required polarization state, ...

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Abstract

The invention relates to a low-laser loss parameter comprehensive measurement device for a high reflector. In the process of developing a high-performance laser gyro, a high reflector in an annular cavity is required to have very low scattering, transmission and back scattering loss; and in an annular laser gyro, loss generated by all elements of a laser cavity is the main reason for the locking of the annular laser gyro. The low-laser loss parameter comprehensive measuring device for the high reflector, which is provided by the invention, comprises a light source assembly and an integrating sphere which are arranged on an optical platform, wherein the light source assembly is provided with a wave plate and an attenuating plate, and the integrating sphere is provided with a photomultiplier, a transmission measurement component A, an integral scattering measurement component B and a back scattering measurement component C. The invention realizes the measurement of integral scattered power, transmissivity and back scattered power on the same device, improves the measurement function of the device, reduces the measurement cost, and can automatically change an incidence angle by rotating a sample in the measurement; and in addition, all the three measurements can obtain two-dimension measured value distribution map of the sample.

Description

technical field [0001] The invention belongs to the technical field of optical element testing, and in particular relates to a comprehensive measurement device for low-loss laser parameters of a high-reflection mirror. Background technique [0002] Low-loss high-reflection mirrors are widely used and play an important role in laser gyroscopes, high-power lasers and other laser systems. For example, a typical laser gyro system has a polygonal (commonly regular quadrilateral or triangular) optical resonator. The rate is as high as 99.99%. In the process of developing a high-performance laser gyroscope, the high reflection mirror in the ring cavity is required to have very low scattering, transmission and backscattering losses, because in the ring laser gyroscope, the loss generated by each component of the laser cavity is the cause of its lock-up important reason. [0003] Accurately measuring low-loss parameters such as integrated scattering rate, transmittance, and backsc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
Inventor 刘卫国高爱华秦文罡王越孙鑫
Owner XIAN TECH UNIV
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