TFT substrate with higher carrier transmission characteristics and preparation method thereof
A technology of transport characteristics and carriers, applied in the manufacturing of semiconductor/solid-state devices, electrical components, transistors, etc., can solve the problems of production line capacity impact, high price, long time, etc., to reduce the preparation time period, improve production capacity, The effect of simplifying the preparation process
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[0022] In this embodiment, the doped amorphous silicon thin film uniformly mixes the non-linear resistance material into the amorphous silicon thin film at a concentration of 1% by weight, and the carrier mobility of the obtained amorphous silicon thin film is 76cm2 / V-second or so (using ACCENTHL5500PC Hall effect test system). The carrier mobility of non-doped conventional amorphous silicon film is 0.3-1.2cm2 / V-second, and the carrier mobility of low-temperature polysilicon film is 150-300cm2 / V-second
[0023] Doped amorphous silicon thin film of the present invention and preparation steps are as follows:
[0024] ① Preparation: Put the cleaned glass substrate on the substrate base of PECVD, and vacuum the system to reach the required pressure. According to the test requirements, the glass substrate is heated, and the temperature of the glass substrate is generally required to reach about 200°C, so that the film can grow uniformly on the glass substrate.
[0025] ② Thin fi...
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