Kit for detecting fragile X syndrome
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- DAAN GENE CO LTD
- Publication Date
- 2013-09-25
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to a kit for detecting fragile X syndrome in clinical samples, in particular to a kit for screening fragile X syndrome by bisulfite modification-long fragment polymerase chain reaction technology. Background technique
[0002] Fragile X syndrome (FraX) is a common hereditary mental retardation syndrome, its incidence is second only to Down syndrome, it is X-linked inheritance, accounting for 40% of X-linked mental retardation. The incidence rate is 1 / 4000 in males and 1 / 6000 in females. Penetrance also varies by gender, 80% for men and 30% for women. Fragile X syndrome has two major characteristics in terms of phenotype: one is mild to severe mental retardation, IQ value between 20-60, accompanied by different degrees of abnormal body shape; big head, square forehead, big ears , Large mandible, most male patients develop large testicles after puberty, and have a clear family history of sex-linked mental retardation. The second ...