Impact tester of single soldered ball
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- GUANGZHOU HKUST FOK YING TUNG RES INST
- Publication Date
- 2012-01-11
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to a test instrument, in particular to a single ball welding anti-shear strength impact tester. Background technique
[0002] The ball array is widely used in electronic packaging technology, and the packaging strength between the ball array and the substrate is one of the basic standards generally recognized by the industry. Previously, to test this strength, the industry generally used a single solder ball shear test to obtain reliable solder ball attachment strength results. However, due to the fact that the low-rate shear test cannot predict the high-strain-rate impact under real conditions, it was later developed into a single-ball impact tester, which has been widely recognized for its high-speed and accurate test results.
[0003] Existing single solder ball impact tester, such as the Chinese invention patent application "Single Solder Ball Impact Tester" published on June 10, 2009 in the Chinese Invention Patent Bulletin,...