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Device and method for measuring coating by using X-ray fluorescence spectrometer

A fluorescence spectrometer and X-ray technology, which is applied in the field of coating measurement devices using X-ray fluorescence spectrometer, can solve the problems of large measurement area, product damage, complicated operation, etc., and achieve reduced errors, stable X-rays, and clear images intuitive effect

Inactive Publication Date: 2010-11-17
上海优特化工有限公司
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Problems solved by technology

However, the magnetic induction measurement method can only be used for magnetic products, the eddy current measurement method can only measure non-magnetic products, the electrolytic measurement method requires a large measurement area and damages the product, and the ultrasonic measurement equipment is complicated to manufacture and inconvenient to operate.
[0003] Elemental analysis mainly relies on chemical analysis, which needs to destroy and dissolve samples, prepare samples for analysis, the operation is complex and time-consuming, and requires high quality operators

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  • Device and method for measuring coating by using X-ray fluorescence spectrometer
  • Device and method for measuring coating by using X-ray fluorescence spectrometer
  • Device and method for measuring coating by using X-ray fluorescence spectrometer

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Embodiment Construction

[0041] figure 1 It is the basic structure diagram of X-ray fluorescence spectrometer;

[0042] The X-ray fluorescence spectrometer consists of a high-voltage generator, a detector, a multi-channel plate, and a CCD camera. A high-voltage generator generates X-rays, which irradiate the sample. The sample produces secondary X-rays of different intensities under the irradiation of X-rays, that is, X-ray fluorescence. X-fluorescence is taken with a CCD camera.

[0043] figure 2 It is the working principle diagram of X-ray fluorescence spectrometer;

[0044] The working principle of X-ray fluorescence spectrometer:

[0045] Fluorescence is the process in which atoms or molecules absorb photons of a certain energy and then release photons of lower energy. X-ray fluorescence is the energy released when the electrons in the inner shell of atoms transition into photons.

[0046] Due to the existence of tube pressure, the cathode generates a large number of electrons to bombard t...

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Abstract

The invention provides a device for measuring a coating by using an X-ray fluorescence spectrometer. The device comprises a high voltage generator, an X-ray tube, a collimator, a lens, a camera, a probe, a multi-channel plate and a computer, wherein the high voltage generator is connected with the X-ray tube to provide high voltage for the X-ray tube; the X-ray tube is connected with the collimator; an electric signal is converted into an electric pulse by probing the X ray reflected by a sample with the probe; the electric pulse is amplified by an amplifier MCA; the amplified signal is transmitted to the multi-channel plate; and a communication signal is formed by the multi-channel plate and transmitted to the computer for processing. The method comprises the following steps of: (1) generating the high voltage; (2) mainly converting kinetic energy of electrons into primary radiation in the X-ray tube; (3) using the collimators with different sizes and shapes; (4) receiving the X fluorescence by a probe window; (5) using a proportional counter filled with xenon gas; (6) transmitting the signal of the amplifier into the computer; and (7) displaying data and the image of the sample on a display.

Description

technical field [0001] The invention relates to the technical field of nuclear physics applications, in particular to a device and method for measuring coatings using an X-ray fluorescence spectrometer. Background technique [0002] At present, the methods of measuring coating include magnetic induction measurement method, eddy current measurement method, electrolytic measurement method, ultrasonic measurement method, etc., which are widely used by domestic and foreign enterprises, factories, trading companies and testing institutions. However, the magnetic induction measurement method can only be used for magnetic products, the eddy current measurement method can only measure non-magnetic products, the electrolytic measurement method requires a large measurement area and damages the product, and the ultrasonic measurement equipment is complicated to manufacture and inconvenient to operate. [0003] Elemental analysis mainly relies on chemical analysis. Chemical analysis req...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/223
Inventor 宋涵华
Owner 上海优特化工有限公司
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