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Static measurement deflector

A technology of electrostatic measurement and deflection device, which is applied in the direction of electrostatic instruments, instruments, teaching models, etc., can solve the problems of inability to intuitively represent the size change of micro-static, the inability to measure with micro-voltage and micro-current, and the high requirement for manufacturing precision. Simple, easy to operate, low cost effect

Inactive Publication Date: 2010-11-17
上海市南洋中学
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] 1. The improved electrostatic measuring instrument of this prior art can only be applied to the measurement of micro-static electricity due to the installation of an electrostatic meter, and cannot be used for the measurement of micro-voltage and micro-current, and the scope of application is small
[0007] 2. Since the improved electrostatic measuring instrument of this prior art is provided with an N-channel depletion type insulating gate field effect transistor and a DC power supply, the structure is complex, the manufacturing precision is high, the cost is high, it is not easy to popularize and apply, and it cannot be intuitive Indicates the size change of the micro static

Method used

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Embodiment Construction

[0025] See attached figure 2 As shown, the rotor device 1 includes a rotor 11, a rotor support 12, a pulley 13, and a groove 14. A rotor 11 is connected to one end of the rotor support 12, and the other end of the rotor support 12 is connected to the pulley 13. The pulley 13 is arranged in the groove 14.

[0026] See attached figure 1 As shown, the electrostatic measuring and deflection device of the present invention includes a moving plate device 1, a pair of fixed plates 21 and 22, a conductive rod 3, a base 4, a support 5, a fur 6 and a rubber rod 7; one end of the conductive rod 3 and one of the One end of the fixed piece 21 is connected vertically, the fur 6 and the rubber rod 7 are arranged on one side of the base 4, a fixed piece 22 is placed on the base 4 in parallel and horizontally, and the other fixed piece 21 is connected to the bracket 5, and is arranged horizontally on a fixed piece 22 Above, a moving piece device 1 is arranged between a pair of fixed pieces 21 a...

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Abstract

The invention discloses a static measurement deflector which comprises a conducting rod, furs and a rubber rod and is characterized by also comprising a base, a bracket, a moving plate device and a pair of stator plates, wherein one end of the conducting rod is vertically connected with one end of one of the stator plates; the furs and the rubber rod are arranged at one side of the base; one stator plate is horizontally arranged on the base, and the other stator plate is connected with the bracket and is horizontally arranged above the one stator plate; the moving plate device is arranged between a pair of the stator plates, and comprises a moving plate, a moving plate bracket, a pulley and a groove; the moving plate slides between a pair of the stator plates; the moving plate and a pair of the stator plates are arc metal sheets; the moving plate is connected with one end of the moving plate bracket, and the other end of the moving plate bracket is connected with the pulley; and the pulley is arranged in the groove. The invention has low cost, simple structure, easy application, small volume, convenient carrying, easy popularization and application, more obvious and lucid experiments, obvious experimental effect, environmental protection, energy saving, safety and practicability.

Description

Technical field [0001] The invention relates to an electrostatic measuring device, in particular to an electrostatic measuring deflection device. Background technique [0002] Currently, there is an existing technology, an electrostatic deflection system for deflecting electron beams and a matrix display device provided with such an electrostatic deflection system. This prior art deflection system has horizontal and vertical deflectors and focusing electrodes. By applying a sufficiently high voltage difference between at least one of the focusing electrode and the deflector, for example, several kilovolts, the bipotential type focusing electron lens can be integrated with the deflection system. As a result, this prior art achieves electron beam deflection while also focusing the electron beam onto the surface to be scanned. In the matrix display device, the electron beam remains focused on the display screen, thereby obtaining a relatively small dot size and high-quality images...

Claims

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Application Information

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IPC IPC(8): G01R5/28G09B23/18
Inventor 奚天敬夏俊
Owner 上海市南洋中学
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