Local spline embedding-based orthogonal semi-monitoring subspace image classification method

A technology of local spline embedding and classification method, applied in computer parts, instruments, character and pattern recognition, etc., can solve problems such as time-consuming

Inactive Publication Date: 2010-12-15
ZHEJIANG UNIV
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  • Application Information

AI Technical Summary

Problems solved by technology

Although supervised algorithms can effectively improve the accuracy of image expression, existing supervised algorithms still have limitations, especially obtaining accurate annotation information takes a lot of time
With the rapid increase in the amount of image data, it is more convenient to obtain unlabeled data, which makes the limitations of supervised learning algorithms that can only process labeled data more obvious.

Method used

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  • Local spline embedding-based orthogonal semi-monitoring subspace image classification method
  • Local spline embedding-based orthogonal semi-monitoring subspace image classification method
  • Local spline embedding-based orthogonal semi-monitoring subspace image classification method

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Experimental program
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Embodiment

[0062] 1. Select n sample data for each image data set as a training set, the training set includes training samples with labeled information and training samples without labeled information, and the rest as a test set;

[0063] 2. Use the training samples with labeled information to construct the inter-class scatter matrix and intra-class scatter matrix:

[0064] Given a training set X={x 1 ,..,x l , x l+1 ,...,x n},in i=1,...,n, the first l samples With category labeling information remaining n-l samples Not marked. Use training samples that contain labeled information Construct the between-class scatter matrix S b and the intra-class scatter matrix S w :

[0065] S b = Σ k = 1 c l k ( μ ( k ) - ...

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Abstract

The invention discloses a local spline embedding-based orthogonal semi-monitoring subspace image classification method. The method comprises the following steps of: 1) selecting n samples serving as training sets and the balance serving as testing sets from image data sets, wherein the training sets comprise marked data and unmarked data; 2) building an extra-class divergence matrix and an intra-class divergence matrix by using the marked data; (3) training data characteristic space distribution by using a whole and building a Laplacian matrix in a local spline embedding mode; 4) according to a local spline, embedding an orthogonal semi-monitoring subspace model, and searching a projection matrix to perform dimensionality reduction on the original high dimension characteristic; 5) building a classifier for the training samples after the dimensionality reduction by using a support vector machine; and 6) performing the dimensionality reduction on the testing sets by using the projection matrix and classifying the testing sets after the dimensionality reduction by using the classifier. In the method, the information, such as image sample marking, characteristic space distribution and the like, is fully utilized; potential semantic relevance among image data can be found out; and image semantics can be analyzed and expressed better.

Description

technical field [0001] The invention relates to an orthogonal semi-supervised subspace image classification method based on local spline embedding. This method extracts features from image data and expresses them as feature vectors, and finds an effective dimensionality reduction method to project them into a low-dimensional semantic space, so as to classify image data by training a classifier model. Background technique [0002] With the popularization of digital cameras and the development of the Internet, the amount of image data collection, storage and access has exploded, and how to efficiently manage the increasingly large-scale image data has become increasingly important. In order to manage images better, an effective means is to manage image data in categories. Therefore, classifying image data has become a hot research issue in recent years. [0003] In the research of image classification, the biggest challenge is the semantic gap, that is, the underlying featur...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62
Inventor 邵建张寅朱科
Owner ZHEJIANG UNIV
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