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Test system of PROM

A test system and inverter circuit technology, applied in the test field, can solve the problems of low test reliability, incapable of PROM test, low yield, etc.

Inactive Publication Date: 2011-01-12
SHENZHEN STATE MICROELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a PROM test system, aiming to solve the problem that the PROM test system provided by the prior art cannot fully test the PROM, the yield rate is relatively low, and the test reliability is not high

Method used

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  • Test system of PROM
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Embodiment Construction

[0011] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0012] In the embodiment of the present invention, the PROM testing system provided can change the programming voltage, working voltage and reading voltage loaded on the PROM according to the test conditions, and can test at different stages of the product. For example, at the wafer stage, unit withstand voltage tests, sense amplifiers and unprogrammed unit leakage tests can be performed; at the packaging stage, stability tests at maximum and minimum operating voltages and programmable margin tests can be performed. Through testing at different stages, defective products of PROM can be screened ...

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Abstract

The invention is applicable to the test technical field and provides a test system of a PROM, which comprises a power supply, a first inverter circuit, a second inverter circuit, a third inverter circuit, a first switch circuit, a second switch circuit, a third switch circuit, a PROM to be tested, a micro control unit MCU and a digital-to-analog circuit DAC which is connected with the micro control unit MCU and is used for converting a digital voltage value output by the MCU to an analog voltage value. The voltage value output by the MCU adjusts the voltage values output by the first inverter circuit, the second inverter circuit and the third inverter circuit to the voltage values meeting test conditions of the PROM, and the test system can be used for unit withstanding voltage test, leakage test of a sense amplifier and a non-programming unit, stability test under the maximum and minimum working voltage and programmable allowance test, and by different tests, defective goods of the RPOM can be screened out, thus improving the quality of company products greatly and improving the performance of a PROM chip.

Description

technical field [0001] The invention belongs to the technical field of testing, in particular to a PROM testing system. Background technique [0002] Test coverage and test time are two important aspects of testing general semiconductor devices, especially one-time programmable memory products. [0003] Existing test to Programmable Read-Only Memory (Programmable Read-Only Memory, PROM) is relatively simple, concrete test system such as figure 1 As shown, it mainly includes: a power supply 11, a first inverter circuit 12, a second inverter circuit 13, a micro control unit MCU 14, a first switch circuit 15, a second switch circuit 16, a PROM to be tested 17 and a voltage regulator 18 . After the programming voltage VPP output by the first inverter circuit 12 and the operating voltage VDD output by the second inverter circuit 13 are respectively controlled by the first switch circuit 15 and the second switch circuit 16, VPP and VDD are respectively output to the PROM 17 to b...

Claims

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Application Information

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IPC IPC(8): G11C29/56
Inventor 谭文堂刘云龙李洛宇练奕龙徐建强周锦刘芳芳
Owner SHENZHEN STATE MICROELECTRONICS CO LTD
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