Method for extracting simulation program with integrated circuit emphasis (SPICE) model of field effect transistor

Abstract

The invention relates to a method for extracting an SPICE model of a field effect transistor, which comprises the following steps of calling long channel region devices, wide channel region devices, and short channel and narrow channel region devices on the basis of a universal model; respectively extracting the model parameters of the long channel region devices, the wide channel region devices, and the short channel and narrow channel region devices by utilizing a parameter extraction method of a regionalization mode and obtaining the model parameters of the long channel region devices, the wide channel region devices, and the short channel and narrow channel region devices by utilizing a least square error fitting method on the basis of the universal model; and extracting the universal model parameters of the field effect transistor according to the model parameters of the long channel region devices, the wide channel region devices, and the short channel and narrow channel region devices. The method for extracting the SPICE model of the field effect transistor simultaneously has the advantages of the universal model and the regionalization model.

Description

technical field [0001] The invention relates to a method for extracting a SPICE model of a field effect transistor. Background technique [0002] A field effect transistor (Metal Oxide Semiconductor, MOS) is an important semiconductor device in a semiconductor integrated circuit, and is widely used in the field of integrated circuit technology. In order to predict the performance and reliability of field effect transistor devices in their environment, simulation of field effect transistors is required. [0003] SPICE (Simulation Program with Intergraded Circuit Emphasis) is the most commonly used circuit-level simulation program in the device design industry. Various software manufacturers provide different versions of SPICE software such as Vspice, Hspice, and Pspice. The simulation cores of these software are similar, and they all use California, USA A SPICE simulation algorithm developed at the University of Berkeley. Usually SPICE software provides a general model (Glo...

AI Technical Summary

Problems solved by technology

The general model is a scalable model (Scalable model), which can be applied to all sizes of devices, but the accuracy of the general model is not as high as that of the regional model, especially in sub-micron devices

Although the regionalization model is a good choice for establishing a SPICE model, the parameters extracted by using the regionalization model are discontinuous, such as the extracted drain-source current parameter IDS and drain-source conductance parameter GDS are discontinuous

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