Method of detecting fruit surface defect based on low pass filter
A defect detection and low-pass filtering technology, which is applied in the direction of optical test defect/defect, instrument, character and pattern recognition, etc., can solve the problems of increasing image processing workload and reducing the processing speed of machine vision system, etc., to achieve strong adaptability, The effect of overcoming complexity
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[0039] The present invention will be further described below in conjunction with drawings and embodiments.
[0040] 1) Image acquisition: take the blue cardboard as the background, put the fruit on the sample table, and take a color image of the fruit;
[0041] 2) Background removal: extract the R and B component images of the color image, such as figure 1 and figure 2 shown. Then according to the B component image histogram image 3 (The peak on the left of the histogram represents the fruit, and the peak on the right represents the background) Select the threshold T=140 to binarize the B component image to form the following Figure 4 In the binary image B' shown, the area with fruit is set to 1, and the rest of the area is set to 0. Using the formula (1), the R component image f(x, y) after removing the background is obtained by dot multiplication between the R component image and the B′ image, as shown in Figure 5 shown;
[0042] f(x,y)=R.*B' (1)
[0043] 3) Cente...
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