Incident differential interference phase contrast microscope

Abstract

The invention belongs to the technical field of microscopes, in particular to an incident differential interference phase contrast microscope. The microscope comprises an observation mirror, an incident illuminator and a differential interference phase contrast component, wherein the differential interference phase contrast component comprises a differential interference prism, an adjusting rod for adjusting the forward and backward movement of the differential interference prism, and an adjusting screw for adjusting the vertical height of the differential interference prism. The incident differential interference phase contrast microscope has the functions of upright observation and polarization observation of a bright field, can perform differential interference phase contrast observation, has a simple structure, is convenient to operate, can acquire micro-images with a uniform field and obvious contrast, can be applied to the fields of modern electronic industry, material scientific research and manufacturing, and the like, and meets the requirement of nondestructive optical detection.

Description

technical field [0001] The invention belongs to the technical field of microscopes, and in particular relates to an epi-type differential interference phase contrast microscope, which enables the observed microscopic image to have obvious contrast contrast and presents an image with a strong three-dimensional effect, so as to improve microscopic observation. resolution. Background technique [0002] Differential interference phase contrast microscopy was proposed by Nomarski in 1952 on the basis of phase contrast microscopy observation technology, using a transmission microscopic observation system, including a polarizer (Polarizer), DIC prism, DIC slider and analyzer (Analyzer) four key optical components. Xu Yuguang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences and other scientific and technological workers carried out technical research on differential interference phase contrast microscopy, and applied for a patent for differential interf...

AI Technical Summary

Problems solved by technology

In the existing epi-type differential interference contrast microscope, a differential interference contrast prism device is added to the polarization observation system. The illumination and imaging systems share the same DIC prism. New requirements are put forward for the design of objective lenses with different magnifications. Special objective lenses for differential interference phase contrast observation need to be configured, which makes the structure of the microscope complicated. At the same time, the design, processing and detection of DIC prisms are relatively complicated.

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