Sputtering method
A sputtering and substrate technology, applied in the field of sputtering, can solve the problems of weak magnetic field strength and film sagging, and achieve the effects of preventing film sagging, uniform film thickness distribution, and increasing plasma density
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Embodiment approach 1
[0050] In this embodiment, the figure 1 The method of correcting the AC power ratio described in . The sputtering conditions were as follows: the sputtering chamber was evacuated to a pressure of 0.3 Pa, seven Al target pairs were arranged in parallel, and an AC power supply was connected to each target pair.
[0051] The supply power of the AC power supply connected to the target pairs at both ends of the parallel arrangement direction is 80kW, and the supply power of the five AC power supplies clamped by the two ends of the AC power supply is 75kW. In the comparative example, under the same conditions as described above, Without correcting the electric power ratio, the supplied electric power of all AC power sources was set to 75 kW.
[0052] image 3 A graph showing the results of this embodiment is shown in . On the horizontal axis, the distance on the substrate to be processed in the same direction as the direction in which the target pairs are arranged side by side i...
Embodiment approach 2
[0058] In this embodiment, the figure 2 The method of adding an auxiliary magnet to increase the strength of the magnetic field described in . The sputtering conditions were the same as those in Embodiment 1. The sputtering chamber was evacuated to a pressure of 0.3 Pa, and the seven Al target pairs were respectively connected to AC power sources. Auxiliary magnets are respectively provided at both end portions in a direction perpendicular to the parallel arrangement direction of the magnetic circuits. In the comparative example, no auxiliary magnet was additionally provided.
[0059] Figure 4 A graph showing the results of this embodiment is shown. The horizontal axis represents the film thickness On the vertical axis, the distance on the substrate to be processed in the direction perpendicular to the direction in which the target pairs are arranged in parallel is represented as the Y-axis direction (mm) of the substrate to be processed. The measurement position is 922...
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