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Method and device for testing state solid disk (SSD)

A test method and technology of solid-state hard disks, applied in the computer field, can solve the problems of different test functions and no solutions.

Active Publication Date: 2012-04-11
中科腾龙信息技术有限公司
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  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Although some SSD testing techniques have been proposed, the test functions performed by each testing technique are not the same. How to combine these testing techniques to fully and completely test the performance of SSD and omit unnecessary test steps has not yet been established. come up with effective solutions

Method used

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  • Method and device for testing state solid disk (SSD)
  • Method and device for testing state solid disk (SSD)
  • Method and device for testing state solid disk (SSD)

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Embodiment Construction

[0021] According to an embodiment of the present invention, a testing method for a solid state disk (hereinafter referred to as SSD) is provided.

[0022] Such as figure 1 Shown, according to the test method of the SSD of the embodiment of the present invention comprises:

[0023] Step S101, in the case that no data is written into the flash chip of the SSD, perform a predetermined performance test on the SSD;

[0024] Step S103, multiple write / delete tests are carried out to the SSD, wherein the write / delete test includes writing full data to all capacities of the SSD, and then deleting the written data (at this time, it can be understood that repeated reading and SSD performance drop during write operations);

[0025] Step S105, continue to write to the SSD within the predetermined first time period, and perform a predetermined performance test on the SSD after the end of the first time period (this step can be understood as a stress test, that is, make the SSD enter the "...

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Abstract

The invention discloses a method and a device for testing a solid state disk (SSD). The method comprises the following steps of: performing predetermined performance test on the SSD under the condition that no data is written into a flash chip of the SSD; performing writing / deletion test on the SSD for multiple times, wherein the step of writing / deletion test comprises a substep of fully writing data to all the capacity of the SSD, and then deleting the written data; continuously performing writing operation on the SSD in a predetermined first time period, and performing predetermined performance test on the SSD after the first time period; allowing the SSD to be in an idle state in a predetermined second time period, and performing predetermined performance test on the SSD in or after the second time period; controlling the SSD to run an appointed application program in a predetermined second time period, and performing determined performance test on the SSD after the third time period; testing compatibility of the SSD with a hard disk controller; and acquiring and analyzing predetermined parameter information of the SSD to acquire a test result.

Description

technical field [0001] The present invention relates to the field of computers, and in particular, to a testing method and device for a solid-state hard disk. Background technique [0002] A solid state disk (SSD for short) is a very popular storage technology at present. Due to the incomparable advantages of SSD over ordinary mechanical hard disks, as the price gradually decreases, the use of SSDs in various application fields has gradually become more and more extensive. With the continuous expansion of SSD usage and usage fields, new requirements are put forward for SSD testing methods and technologies. Generally speaking, most of the tools for testing SSDs in the PC / notebook / server field are the same as those used for testing hard drives. However, since the working principle of SSD is completely different from that of ordinary hard disk, it is necessary to formulate targeted testing methods and procedures according to the inherent working characteristics of SSD, so as ...

Claims

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Application Information

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IPC IPC(8): G11C29/08G11C29/56
Inventor 赵雷历军聂华邵宗有沙超群朱越
Owner 中科腾龙信息技术有限公司
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