Method for removing surface dust of mask plate

A mask plate and fine dust technology, which is applied in the field of dust removal on the surface of the mask plate, can solve the problems of damage to the mask protective film 2, not increasing the blowing pressure, and damage to the mask plate 1, so as to reduce the risk of damaging the mask plate, Improve dust removal efficiency and remove charged dust

Inactive Publication Date: 2012-04-25
SHANGHAI HUALI MICROELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The mask used in the semiconductor chip manufacturing industry has high requirements on dust. When the particle size of the dust is large enough, it will be projected onto the silicon wafer during the photolithography process and destroy the chip circuit pattern, so it must be removed; clean the surface of the mask. The method of removing dust is generally to use blowing to remove the dust on the mask, such as blowing air gun to blow nitrogen air, air curtain, etc.; but because the surface of the mask is generally adsorbed with charged dust, such as figure 1 As shown, when the blowing air gun 3 is used for simple air blowing, the charged particles 4 cannot be removed when the air blowing pressure is low, and increasing the air blowing pressure will cause certain damage to the mask plate 1, especially for hundreds of The damage to the micron-thick mask protection film 2 (pellicle) is serious, and it can even lead to its scrapping
[0003] However, at present, there is no method that can improve the dust removal efficiency, remove a little dust, and reduce the risk of damaging the mask without increasing the blowing pressure.

Method used

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  • Method for removing surface dust of mask plate
  • Method for removing surface dust of mask plate
  • Method for removing surface dust of mask plate

Examples

Experimental program
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Effect test

Embodiment 1

[0027] Such as Figure 2-5 As shown, the present invention provides a method for removing fine dust on the surface of a mask plate, which includes the following steps:

[0028] First, adjust the blowing air pressure of the blowing air gun 23 according to the air pressure value of the mask plate 21 and the mask protective film 22 on it, and blow the mask plate 21 and the mask protective film 22 to remove the air pressure on the mask plate 21 and the mask protective film 22 Part of the dust 24, at this time, the gas blown out by the blowing air gun 23 is air or nitrogen.

[0029] After the blowing air gun 23 blows air for a period of time, under the condition that the blowing air pressure remains unchanged, the gas blown out by the blowing air gun 23 is generally manually converted into a gas with positive ions to neutralize the adsorption on the mask plate. 21 and the negatively charged dust 24 on the mask protection film 22 1 Electricity, so that it is blown away from the ma...

Embodiment 2

[0034] Such as Figure 6 As shown, at first, adopt the same steps as in Embodiment 1, adjust the blowing air pressure of the air-blowing air gun 33 according to the air pressure value that the mask plate 31 and the mask protective film 32 on it bear, to the mask plate 31 and the mask The mold protection film 32 is blown to remove part of the dust 34 thereon. At this time, the gas blown out by the blowing air gun 33 is air or nitrogen.

[0035] After the blowing air gun 33 blows air for a period of time, under the condition that the blowing air pressure remains unchanged, the polarity of the residual charged dust particles on the surface of the mask plate 31 and the mask protective film 32 is detected by the charge test sensor 35; Such as Figure 7 As shown, if it is detected that the residual charged dust particles on the surface of the mask plate 31 and its mask protection film 32 are negative ion dust particles 34 1 , then the gas blown out of the air-blowing air gun 33 is...

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Abstract

The invention relates to a method for removing dust, especially relates to a method for removing surface dust of a mask plate. According to the invention, under the premise that the air blowing pressure is not raised, the method for removing the surface dust of the mask plate can eliminate the adsorption capacity of the dust through blowing ionic wind to neutralize the electrical property of the charged dust, thereby the dedusting efficiency can be raised, the charged dust can be removed, the risk of destroy on the mask plate is reduced, and the technology is simple and easy to operate.

Description

technical field [0001] The invention relates to a method for removing fine dust, in particular to a method for removing fine dust on the surface of a mask plate. Background technique [0002] The mask used in the semiconductor chip manufacturing industry has high requirements on dust. When the particle size of the dust is large enough, it will be projected onto the silicon wafer during the photolithography process and destroy the chip circuit pattern, so it must be removed; clean the surface of the mask. The method of removing dust is generally to use blowing to remove the dust on the mask, such as blowing air gun to blow nitrogen air, air curtain, etc.; but because the surface of the mask is generally adsorbed with charged dust, such as figure 1 As shown, when the blowing air gun 3 is used for simple air blowing, the charged particles 4 cannot be removed when the air blowing pressure is low, and increasing the air blowing pressure will cause certain damage to the mask plate...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G03F1/82B08B5/02
Inventor 戴韫青王剑毛智彪
Owner SHANGHAI HUALI MICROELECTRONICS CORP
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