Parameter calibration method for measuring device with conical surface scanning rotating laser beam

A measuring device and parameter calibration technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as difficulty in obtaining parameter solutions and complex algorithms, and achieve the effects of simple structure, improved calibration accuracy, and easy processing

Inactive Publication Date: 2012-05-09
SHANGHAI UNIV
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  • Abstract
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Problems solved by technology

Due to the non-direct measurability of the laser, high-precision measuring instruments cannot complete the direct calibration of the parameters of the entire measuring device
However, if...

Method used

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  • Parameter calibration method for measuring device with conical surface scanning rotating laser beam
  • Parameter calibration method for measuring device with conical surface scanning rotating laser beam
  • Parameter calibration method for measuring device with conical surface scanning rotating laser beam

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Embodiment Construction

[0026] Embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings, but the present invention is not limited to the present embodiments, and any adoption of structures similar to the present invention and similar changes thereof should be included in the scope of protection of the present invention.

[0027] Such as figure 2 As shown, a measuring device calibrated by the present invention is a measuring device whose measuring beam scans on a conical surface, including a servo motor 1 , an upper and lower transmission shaft 2 , a rotating servo motor 3 , a connector 4 , and a laser displacement sensor 5 . The servo motor 1 drives the rotary servo motor 3 to move up and down through the upper and lower transmission shafts 2, the laser displacement sensor 5 is connected to the rotary servo motor 3 through the connector 4, and the rotary servo motor 3 passes through The connector 4 drives the laser displacement sens...

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Abstract

The invention provides a parameter calibration method for a measuring device with a conical surface scanning rotating laser beam. Before practical measurement, parameter calibration is performed on the measuring device with the conical scanning rotating laser beam. Parameter calibration is performed on the measuring device by adopting a method in which direct calibration and indirect calibration are combined. The method comprises the following calibration steps of: calibrating parameters of the conical surface scanning beam; and calibrating the azimuths of upper and lower transmission shafts under a coordinate system of the conical surface scanning beam. In the calibration method, the advantages of direct calibration and indirect calibration are fully utilized, and a calibration device needed by the indirect calibration is simple, has low cost and is easy to realize. In an indirect calibration algorithm, an optimal method is adopted, so that the influences of errors can be reduced to the maximum extent, and the calibration accuracy is increased.

Description

technical field [0001] The invention relates to a method for calibrating parameters of a measuring device, in particular to a method for calibrating parameters of a measuring device in which a rotating beam scans a conical surface, and belongs to the field of industrial measurement. Background technique [0002] The calibration method of the measuring device is mainly divided into two types in terms of technical means. One is direct calibration, which uses high-precision measuring instruments to directly measure the parameters of the measuring device. This calibration method is relatively easy to implement and has high precision, but there is a premise that the parameters of the measuring device must be directly measurable or elicited. The other is indirect calibration, which uses the measuring device to scan and measure the standard block (such as a high-precision sphere, etc.), so as to indirectly mark the parameters of the measuring device. This method can calibrate param...

Claims

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Application Information

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IPC IPC(8): G01B11/24
Inventor 李明梁爽赵幸福杨恢盛翠园梅沛李娜李伟田应仲
Owner SHANGHAI UNIV
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