Resistance strain thickness measuring device and measurement method thereof
A technology of resistance strain type and thickness measurement, which is applied in the field of mechanical test and geometric quantity measurement, can solve the problems of complex measurement system and interference, achieve the effect of simple calibration method, improve measurement resolution and ensure measurement accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] The present invention will be further described below in conjunction with accompanying drawing.
[0031] refer to figure 1 , figure 2 , the resistance strain type thickness measurement device includes a double cantilever beam resistance strain type thickness measurement sensor 1 and a resistance strain gauge 2, the double cantilever beam resistance strain type thickness measurement sensor 1 consists of a U-shaped elastic body 4, two pins with positioning pins or threads Conical top measuring contact 5 of the rod and four uniaxial resistance strain gauges R 1 , R 2 , R 3 , R 4 Composition; U-shaped elastic body 4 is symmetrical in shape, and its geometric structure includes a base ef and two cantilever beams C fixedly connected to both ends of the base ef 1 and C 2 ; cantilever beam C 1 and C 2 The geometric structure of the head is divided into two sections, the head ac and the neck ce; the length of the head ac section is greater than that of the neck section ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com