Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Resistance strain thickness measuring device and measurement method thereof

A technology of resistance strain type and thickness measurement, which is applied in the field of mechanical test and geometric quantity measurement, can solve the problems of complex measurement system and interference, achieve the effect of simple calibration method, improve measurement resolution and ensure measurement accuracy

Inactive Publication Date: 2012-06-20
ZHEJIANG UNIV
View PDF7 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Optical measurement technology has the advantage of non-contact, but the measurement system is generally more complex, and is easily disturbed by environmental factors such as vibration, so there are great limitations in application

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Resistance strain thickness measuring device and measurement method thereof
  • Resistance strain thickness measuring device and measurement method thereof
  • Resistance strain thickness measuring device and measurement method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The present invention will be further described below in conjunction with accompanying drawing.

[0031] refer to figure 1 , figure 2 , the resistance strain type thickness measurement device includes a double cantilever beam resistance strain type thickness measurement sensor 1 and a resistance strain gauge 2, the double cantilever beam resistance strain type thickness measurement sensor 1 consists of a U-shaped elastic body 4, two pins with positioning pins or threads Conical top measuring contact 5 of the rod and four uniaxial resistance strain gauges R 1 , R 2 , R 3 , R 4 Composition; U-shaped elastic body 4 is symmetrical in shape, and its geometric structure includes a base ef and two cantilever beams C fixedly connected to both ends of the base ef 1 and C 2 ; cantilever beam C 1 and C 2 The geometric structure of the head is divided into two sections, the head ac and the neck ce; the length of the head ac section is greater than that of the neck section ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a resistance strain thickness measuring device, which comprises a double cantilever beam resistance strain thickness measuring sensor and a resistance strain measuring instrument, wherein the double cantilever beam resistance strain thickness measurement sensor consists of a U-shaped elastomer, two conic apex measuring contacts with a positioning shaft pin or threaded rod and four single-shaft strainmeters R1, R2, R3 and R4. The thickness measuring device is calibrated by using a thickness regulator; and the calibrated thickness measuring device is used for measuring the static thickness and dynamic thickness of a sample. The structure of the thickness measuring device is simple, the resolution ratio of the thickness measuring device is less than 0.1 micrometer, and the thickness measuring device can measure the thickness of a geometric solid in fields of material mechanical performance tests and machining; and in the field of material mechanical performance tests, the thickness measuring device can measure the thickness of a sample in a process of deformation under load in a thickness extension manner in real time.

Description

technical field [0001] The invention relates to a resistance strain type thickness measurement device and its measurement method, which is suitable for static thickness measurement and dynamic thickness measurement of non-circular cross-section samples in material mechanics tests, as well as thickness measurement of objects in other fields such as machining, and belongs to Technical fields of mechanical testing and geometric quantity measurement. Background technique [0002] In scientific research and engineering technology, thickness is one of the most basic characteristic quantities of objects. Thickness can be divided into static (steady-state) thickness and dynamic thickness, that is, thickness that does not change with time and thickness that changes with time. Thickness measurement usually refers to static thickness measurement. For example, in the technical field of material mechanics test, for the conventional tensile mechanical performance test of rectangular cros...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B7/06
Inventor 鲁阳胡惠君雷华
Owner ZHEJIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products