ATE (Automatic Test Equipment) test circuit for PLL (Phase Locked Loop) and test method thereof

Abstract

The invention discloses an ATE (Automatic Test Equipment) test circuit for PLL (Phase Locked Loop) and a test method thereof. The test circuit is arranged at the periphery of a tested PLL circuit, and comprises a test control circuit, a test switch, one or more counters, a comparator and a test result output circuit, wherein the comparator corresponds to each counter. The test method comprises the following steps of: (1) configuring PLL circuit parameters and the test control circuit; (2) starting the test switch; (3) counting by the counter; (4) closing the test switch; (5) comparing, by the comparator, an output value of the counter with a standard value; and (6) outputting the test result. The test circuit provided by the invention is organized in the form of module; the output of the test circuit can be effectively tested in a PLL operation process; the correctness of the PLL output can be judged; the test result is directly output at the end of test; the hardware expenditure is low; the control is simple; and the complexity and the operation difficulty of a test vector used by the ATE are greatly reduced.

Description

technical field [0001] The present invention relates to the field of automatic testing, in particular to the field of testing methodology for ATE (Automatic Test Equipment, i.e. automated testing equipment) testing machines, and more specifically to the field of PLL (Phase Locked Loop, i.e. phase locked loop) circuits Test circuits and test methods. Background technique [0002] With the rapid development of the integrated circuit industry, integrated circuit testing plays an increasingly important role in the industry chain, and specialized integrated circuit testing is an important part of the integrated circuit industry. In the current integrated circuit industry, due to the limitations of special testers, non-standardization and the long development cycle of special testers, the use of special testers has been greatly restricted. Its versatility, standardization, portability and openness have quickly become the mainstream of the integrated circuit testing industry. [...

AI Technical Summary

Problems solved by technology

In addition, because the PLL in some circuits cannot guarantee that the clock signals in each product have a uniform phase relationship during mass production, it is impossible to find a unified ATE test vector to test the output of the PLL circuit in real time

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