Method for evaluating storage life of capacitor by using acceleration tests
A storage life and accelerated test technology, applied in the direction of instruments, measurement of electricity, measurement of electrical variables, etc., can solve the problems of long test cycle, high cost, and many samples required, and achieve a shortened test cycle, less samples, and low cost. Effect
Inactive Publication Date: 2012-07-18
CHINA AEROSPACE STANDARDIZATION INST
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[0008] However, the traditional method of evaluating the storage life of capacitors has a long test cycle, high cost, and many samples are required, and cannot give the failure activation energy and life of a single sample.
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[0029] Such as figure 1 As shown, the test system of the present invention includes a power supply for supplying power to the device under test and / or other test equipment in the test chamber. The testing system also includes device testing equipment, which is used to test the parameters of the device under test. The test system also includes: a temperature / humidity sensor for the device under test, used to measure the ambient temperature and / or humidity of the device under test; a test box temperature / humidity sensor, used for measuring the temperature and / or humidity in the test box. Apart from figure 1 In addition to the components shown, the test system of the present invention may also include other test equipment.
[0030] In one aspect, the present invention provides a method for evaluating the storage life of a capacitor using an accelerated test, the method comprising the steps of:
[0031] 1) Take a certain number of tested capacitors in the evaluated capacitor ba...
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The invention provides a method for evaluating storage life of a capacitor by using acceleration tests. The method comprises the steps: 1), extracting a certain amount of samples from evaluated capacitors, numbering each capacitor, then measuring and recording the capacitance of each capacitor, and dividing the capacitors randomly into a plurality of groups; 2), taking one group of capacitors to conduct a room-temperature storage test, taking and testing one batch of samples at certain intervals, and recording the capacitance change after storage, so as to obtain a curve of the change of room-temperature storage capacitance along with time; 3), performing the storage tests at different temperatures, and determining a proper temperature by a diagnostic test and using the temperature as acceleration stress; 4), performing the storage test at the higher temperature determined by the step 3), performing the test at certain intervals like the step 2), and recording the capacitance change after storage, so as to obtain a curve of the change of storage capacitance along with time; 5), by using curve fitting, verifying whether the change tendencies at different temperatures are the same; 6), performing data analysis and calculating the storage life of the capacitor at the room temperature.
Description
technical field [0001] The invention relates to a method for evaluating the storage life of a capacitor by using an accelerated test, and more particularly relates to a method for rapidly evaluating the storage life of a capacitor by using an accelerated test based on the analysis of sensitive parameters. Background technique [0002] Life test is a basic reliability test method. Under normal working conditions, life test methods are often used to evaluate product reliability. However, this method is not a suitable method for products with a particularly long life. Because this method takes a long time to test, and it is often too late to complete the life test, new products are designed, and old products will be eliminated. Therefore, the accelerated life test method of increasing stress and shortening time formed on the basis of life test has gradually replaced the conventional life test method. [0003] The accelerated life test is to increase the test stress (such as t...
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IPC IPC(8): G01R31/00
Inventor 刘文宝
Owner CHINA AEROSPACE STANDARDIZATION INST