A kind of led life testing system and testing method thereof
A technology for life testing and subsystems, applied in the structure of refrigerators, cold and hot dual-zone temperature boxes, and LED fixed parts, can solve the problems of increasing test uncertainty, failing to achieve test purposes, increasing aging costs, etc. The effect of improving reliability and continuity, facilitating failure causes, and improving test efficiency
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[0042] The LED life test system of the present invention includes an aging subsystem that uses a cold and hot dual-zone temperature box for aging and a measurement subsystem that uses an integrating sphere for photochromic and electrical measurements, and also includes such as figure 1 The cooler 1 shown and as Figure 4 The shown aluminum substrate 3 for welding multiple LEDs to be tested, such as Figures 1 to 4 As shown, the refrigerator 1 includes a mounting plate 101, an electric cooling plate 102 and a radiator 104, the electric cooling plate 102 and the mounting plate 101 are fixedly installed on the radiator 104, and the middle part of the mounting plate 101 has an opening 101a, the electric cooling plate 102 is embedded in the opening 101a (in this embodiment, the electric cooling plate 102 and the opening 101a can have a matching outline, so that the former is just embedded in the latter), and the radiator 104 is located on the side facing the bottom surface of the ...
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