A kind of led life testing system and testing method thereof

A technology for life testing and subsystems, applied in the structure of refrigerators, cold and hot dual-zone temperature boxes, and LED fixed parts, can solve the problems of increasing test uncertainty, failing to achieve test purposes, increasing aging costs, etc. The effect of improving reliability and continuity, facilitating failure causes, and improving test efficiency

Inactive Publication Date: 2014-10-08
常州市产品质量监督检验所 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This brings about several problems: First, repeated disassembly and installation requires a lot of labor and time, which dramatically increases the cost of aging and wastes time; second, repeated disassembly and installation can easily damage the LED, increasing the uncertainty of the entire test , that is to say, the tester may not be able to judge whether the damage of a certain LED is caused by human factors during the disassembly process or the product quality of the LED itself, which cannot achieve the purpose of the test; moreover, it is very easy during the disassembly and installation process Stains and scratches on the optical lens of the LED will affect its light output characteristics, thereby affecting the measurement results and causing deviations in the calculation results
However, after the LED is lit, the temperature will rise sharply, resulting in a huge temperature difference between the surface and the surrounding air.

Method used

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  • A kind of led life testing system and testing method thereof
  • A kind of led life testing system and testing method thereof
  • A kind of led life testing system and testing method thereof

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Embodiment Construction

[0042] The LED life test system of the present invention includes an aging subsystem that uses a cold and hot dual-zone temperature box for aging and a measurement subsystem that uses an integrating sphere for photochromic and electrical measurements, and also includes such as figure 1 The cooler 1 shown and as Figure 4 The shown aluminum substrate 3 for welding multiple LEDs to be tested, such as Figures 1 to 4 As shown, the refrigerator 1 includes a mounting plate 101, an electric cooling plate 102 and a radiator 104, the electric cooling plate 102 and the mounting plate 101 are fixedly installed on the radiator 104, and the middle part of the mounting plate 101 has an opening 101a, the electric cooling plate 102 is embedded in the opening 101a (in this embodiment, the electric cooling plate 102 and the opening 101a can have a matching outline, so that the former is just embedded in the latter), and the radiator 104 is located on the side facing the bottom surface of the ...

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Abstract

The invention discloses a LED life test system, which includes a refrigerator, an aluminum substrate, a temperature box with dual zones of cold and hot, and an integrating sphere. The electric cooling plate and the mounting plate of the former are fixedly installed on the Embedded in the opening of the mounting plate; the aluminum base plate is fixed on the surface of the electric refrigeration plate; the cold and hot dual-zone temperature box includes a cold box and a hot box separated by a heat insulation plate, and useful When the refrigerator is installed on the installation holes of the temperature box and the integrating sphere, the radiator is placed outside the cold box and the integrating sphere, and the aluminum substrate is placed on the hot box and the integrating sphere respectively. the inside of the ball. The refrigerator of the present invention can be moved as a whole without disassembling the LED, which greatly facilitates the life test of the LED; in addition, by connecting the lead wire of the aluminum substrate wiring solder joint to the switch switching circuit, each LED can be individually lit. LED, so as to achieve the purpose of individually testing the light, color and electricity parameters of each LED.

Description

technical field [0001] The present invention relates to an LED life test system and its test method, in particular to the structure of LED fixed part, refrigerator, and cold and hot dual-zone temperature box in the LED life test system, and the test method related to the improvement of the above structure. Background technique [0002] After a single LED is produced, an evaluation of its lifespan is required. At present, the more common practice is to extract certain LED samples from a batch of LEDs of the same type and age them for thousands of hours (usually not less than 6000 hours). Before aging, test the light, color, electricity parameters of each LED, And during the aging process, measure its photochromic and electrical parameters at regular intervals; the longer the aging time, the greater the attenuation of the LED light output, save the results of each measurement, and calculate the light output of the LED after aging according to a certain algorithm Attenuation, ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/44G01K7/02
Inventor 施朝阳陈云明邓恒波
Owner 常州市产品质量监督检验所
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