Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Output stage quick response circuit and response method thereof

A fast-response, output-stage technology, applied in logic circuits, electrical components, pulse technology, etc., can solve the problems that the rising edge time of the output stage output signal cannot be reduced, and the turn-off time of the output transistor has no help, etc., to achieve high-efficiency rise Effect of edge and falling edge time course, reduced rising edge time, accelerated state transition

Active Publication Date: 2012-10-03
赛卓电子科技(上海)股份有限公司
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this circuit structure does not help the turn-off time of the output transistor, that is, it cannot reduce the rising edge time of the output signal of the output stage.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Output stage quick response circuit and response method thereof
  • Output stage quick response circuit and response method thereof
  • Output stage quick response circuit and response method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0042] see image 3 , The present invention discloses a fast response circuit of an output stage, said circuit comprising: an input stage 10 , a driver stage 20 , an acceleration stage 30 , and an output stage 40 . This embodiment includes several transistors, and the transistors can be triodes based on bipolar technology, or MOS transistors based on CMOS technology; this embodiment uses the transistor as an example to introduce the fast response circuit of the present invention.

[0043] The input stage 10 is used for receiving an input signal VIN. In this embodiment, the input stage 10 includes a first triode MP1; the base of the triode MP1 is connected to the input signal terminal VIN, the collector is connected to the driving stage 20, and the emitter is connected to the power supply voltage VCC.

[0044] The output stage 40 includes a second transistor MN1 for outputting an output signal OUT. The base of the second transistor MN1 of the output stage is connected to the ...

Embodiment 2

[0060] see Figure 4 The difference between this embodiment and Embodiment 1 is that in this embodiment, the fast response circuit of the present invention uses a MOS transistor based on CMOS technology (replacing the triode in Embodiment 1) to realize the technical solution of the present invention.

[0061] The input stage is used for receiving the input signal VIN. The input stage includes a first MOS transistor MP1; the gate of the MOS transistor MP1 is connected to the input signal terminal VIN, the drain is connected to the driving stage, and the source is connected to the power supply voltage VCC.

[0062] The output stage includes a second MOS transistor MN1 for outputting an output signal OUT. The gate of the second MOS transistor MN1 of the output stage is connected to the second end of the first resistor R1, the drain of the second MOS transistor MN1 is connected to the signal output end, the second end of the fourth resistor Rload, and the second end of the fourth...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an output stage quick response circuit which comprises an input stage, an output stage, a drive stage and an accelerating stage; the accelerating stage is connected with the drive stage for reducing the rising edge time and the falling edge time of the output signal of the output stage; a predetermined amount of current is set in advance for the accelerating stage, when a second transistor MN1 of the output stage needs to be opened, the pre-set current quickly flows into the second transistor MN1 in order to shorten the opening time of the second transistor MN1 and the falling edge time of the output signal, when the second transistor MN1 of the output stage needs to change into the close state from the open state, the accelerating stage quickly extracts the surplus current carrier of a base electrode of the second transistor MN1 of the output stage so as to accelerate the state transformation and shorten the rising edge time of the output signal. With the adoption of the output stage quick response circuit and the response method of the circuit, the problems of too long rising edge time and falling edge time of the output stage signal in an analogue integrated circuit are solved.

Description

technical field [0001] The invention belongs to the technical field of analog integrated circuit design, and relates to a quick response circuit, in particular to an output stage quick response circuit; meanwhile, the invention also relates to a quick response method of the output stage quick response circuit. Background technique [0002] The switching speed of the integrated circuit is a key parameter, which directly affects the operating frequency of the circuit. More importantly, to obtain a square wave close to the ideal, it is necessary to minimize the rising edge time and falling edge time. The rising and falling edge times reflected in the circuit are the times when a transistor transitions from the on state to the off state or from the off state to the on state. According to semiconductor physics and transistor principles, the transition of a transistor from an on state to an off state, and from an off state to an on state is a process of carrier flow, which takes a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H03K19/01H03K19/094
Inventor 宋红刚徐威群
Owner 赛卓电子科技(上海)股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com