Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and device for processing data

A technology of parameters and coefficients, applied in the field of large-scale data processing methods and devices, can solve problems such as inability to obtain mapping relationships efficiently and quickly, low work efficiency, and obstacles to large-scale applications of metamaterials

Active Publication Date: 2012-11-07
KUANG CHI INST OF ADVANCED TECH +1
View PDF2 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] It is conceivable that in the prior art, the known parameters of the metamaterial unit structure to find the electromagnetic response curve, or the known electromagnetic response curve to find the parameters of the metamaterial unit structure, the work efficiency is very low, and it cannot be efficiently and quickly Obtain the mapping relationship between the parameters of the metamaterial unit structure and the corresponding electromagnetic response curve, thus hindering the large-scale application of metamaterials

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for processing data
  • Method and device for processing data
  • Method and device for processing data

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0023] see figure 1 , the first embodiment of the data processing method of the embodiment of the present invention includes:

[0024] 101. Acquire training samples, and initialize Dirichlet process parameters and Gaussian process parameters, wherein the training samples include geometric parameters of the unit structure and corresponding cubic spline coefficients of the electromagnetic response curve;

[0025] The mixed non-parametric statistical regression model of Dirichlet Processes and Gaussian Processes is selected as the mathematical model describing the relationship between the geometric parameters of the metamaterial unit structure and the cubic spline coefficients of the response curve to electromagnetic waves;

[0026] The measured geometric parameters of the unit structure and the corresponding cubic spline coefficients of the response cu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An embodiment of the invention provides a method for processing data. The method includes: acquiring a training sample, initiating a Dirichlet process and a Gaussian process, acquiring a maximum Gaussian process parameter corresponding to a maximum posterior likelihood value of Gaussian process parameters and a region partition corresponding to the maximum Gaussian process parameter according to the training sample, and fitting mapping relations of unit structure geometry parameters and corresponding electromagnetic response curve cubic spline coefficients; wherein the training sample comprises the unit structure geometry parameters and the corresponding electromagnetic response curve cubic spline coefficients. During specific application, as long as the unit structure geometry parameters are known, highly close electromagnetic response curve cubic spline coefficients can be estimated, and accordingly corresponding electromagnetic response curves can be known.

Description

【Technical field】 [0001] The invention relates to the field of computers, in particular to a large-scale data processing method and device. 【Background technique】 [0002] Metamaterial technology is a cutting-edge cross-technology, and the technical fields of its design include electromagnetic, microwave, terahertz, photonics, advanced engineering design system, communication, semiconductor and other fields. Its core idea is to use complex artificial microstructure design and processing to realize artificial "atoms" to respond to electromagnetic fields or sonar. Its core theory is anamorphic optics describing electromagnetic wave trajectories and metamaterial properties. One of the core difficulties of this technology is how to model and design thousands of different artificial microstructures and arrange them reasonably to form a metamaterial device with special functions. This has brought great difficulties to modeling, calculation, theoretical analysis, design, and debu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 刘若鹏刘斌季春霖王睿
Owner KUANG CHI INST OF ADVANCED TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com