Total variation-based self-adaptation non-uniformity correction method for infrared focal plane

A non-uniformity correction, infrared focal plane technology, applied in radiation pyrometry, optical radiometry, instruments, etc., can solve problems such as convergence speed and "ghosting" effect that are not well resolved, and reduce ghosting "Effects, Avoiding Ghosting" effects, effects that reduce the amount of computation

Inactive Publication Date: 2012-11-14
NANJING UNIV OF SCI & TECH
View PDF3 Cites 18 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the above algorithms do not solve th

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Total variation-based self-adaptation non-uniformity correction method for infrared focal plane
  • Total variation-based self-adaptation non-uniformity correction method for infrared focal plane
  • Total variation-based self-adaptation non-uniformity correction method for infrared focal plane

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0018] Combine figure 1 , The present invention is based on the total variation-based adaptive infrared focal plane non-uniformity correction method, the specific steps include the following:

[0019] Step 1. Obtain the forward and backward gradient F from the original image according to the odd and even frame f (i,j), F b (i,j), namely

[0020] F f,y (i,j)=X(i,j)-X(i+1,j)

[0021] F f,x (i,j)=X(i,j)-X(i,j+1)

[0022] F b,y (i,j)=X(i,j)-X(i-1,y)

[0023] F b,x (i,j)=X(i,j)-X(i,j-1)

[0024] F f (i,j) is the forward gradient with the center coordinate of (i,j) in odd frames, F b (i,j) is the backward gradient with the center coordinate of (i,j) in the even frame, X(i,j) is the estimated value of the pixel correction with the center coordinate of (i,j), F f,x (i,j), F f,y (i, j) are the forward gradients in the x and y directions, respectively;

[0025] Among them, according to the different odd and even frames of the image sequence, the forward and backward gradient values ​​are calcul...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a total variation-based self-adaptation non-uniformity correction method for an infrared focal plane. The method comprises the following steps of: firstly, calculating root mean squares in different directions of gradient approximately as the total variation, and calculating a standard deviation in a neighborhood of a window at the same time for control of an iteration speed; and secondly, correcting an infrared image in non-uniformity with the most fast gradient descent algorithm in combination with a traditional neural network algorithm. In the method, calculated quantity is reduced, an algorithm effect is not influenced, an influence of an edge variation on an ideally-expected image is reduced, therefore, a ''ghost'' effect is effectively reduced.

Description

technical field [0001] The invention belongs to the technical field of image processing in infrared focal plane array detection technology, in particular to an adaptive infrared focal plane non-uniformity correction method based on total variation. Background technique [0002] Infrared focal plane array (IRFPA) detector has the advantages of high detection sensitivity, compact structure, passive imaging, good for concealment, day and night work, etc. It is widely used in industry, agriculture, aerospace, medicine, security, aviation, remote sensing and scientific research. However, due to the limitations of the basic manufacturing process, the responsivity of each unit of the detector array is inconsistent, resulting in fixed pattern noise superimposed on the image, seriously affecting the imaging quality of the system, reducing the spatial resolution, temperature resolution, The correct measurement of detection distance and radiation directly restricts the final performanc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01J5/00G01J5/10
Inventor 陈钱任建乐顾国华钱惟贤路东明隋修宝何伟基任侃张闻文于雪莲李宏哲毛晨
Owner NANJING UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products