Calibration method for photovoltaic module testers

Abstract

The invention relates to a calibration method for photovoltaic module testers. The method comprises the following steps of: carrying out first calibration on a standard module, and determining machine parameters affecting a filling value, wherein a situation that the electrical property of the standard module is unchanged can be determined, and the first calibration is implemented in a power calibration mode; in the follow-up calibration of a module tester, carrying out calibration in a short-circuit current calibration mode according to the determined machine parameters affecting the filling value in the first calibration; in the process of calibration, if finding that the filling value has abnormal changes and the abnormal changes are caused by the parameters of the standard module, carrying out calibration still in the short-circuit current calibration mode; and if the abnormal changes are caused by the abnormal state of the module tester, screening and modifying the state of the module tester, or carrying out calibration in a power calibration mode. According to the calibration method, the influence of different module testers on the test power is reduced, and the attenuation and damage of standard modules and the influence of abnormal testers on the test power are weakened, thereby avoiding the fluctuation of the test power caused by the frequent replacement of standard modules.

Description

technical field [0001] The invention relates to a method for calibrating a photovoltaic module tester. Background technique [0002] At present, most of the various component testers in the photovoltaic industry support two calibration methods: short-circuit current calibration and power calibration (ie, efficiency calibration). At the same time, many component factories have component testers from more than one manufacturer, and different hardware and software structures will cause large differences in test results. Different calibration methods and component testers from different manufacturers will inevitably bring great troubles to factories that want to unify test standards. [0003] In theory, the loss of electrical performance of the standard part itself is not allowed, so as to avoid the falsely high impact on the component test power after calibration. However, in the actual photovoltaic industry production, the electrical parameters of photovoltaic standard compo...

AI Technical Summary

Problems solved by technology

However, in the actual production of the photovoltaic industry, the electrical parameters of photovoltaic standard components will cause certain attenuation after repeated use, and the movement during multiple uses will also cause physical damage to standard components, both of which make standard components no longer Stability, so that there is a deviation in the test data when the component power test is performed according to a simple short-circuit current calibration or power calibration component tester

[0004] If the standard components are replaced after short-term use, the following problems will be caused: the manufacturer of the component tester generally promises that the stability is + / -3%, and the standard components calibrated by the testing machine or between batches of standard components The difference is obvious, frequent replacement cannot guarantee the stability of the test level, and it is difficult for the factory to grasp the real process capability

At the same time, the production cycle of standard components and the cost of standard components themselves will also make this simple solution impossible to implement in practical applications.

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