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Three-dimensional micro-drive four-electrode replaceable probe

A four-electrode, three-dimensional technology, applied in the field of three-dimensional micro-drive four-electrode probe, can solve the problem of not being able to install four probes, and achieve the effect of simple plugging and unplugging

Active Publication Date: 2013-01-09
SHANGHAI JIAO TONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the current scanning tunneling microscope, the scanning tubes are all designed and shaped, and can only be measured with a single probe, and its probe base cannot be equipped with four probes.

Method used

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  • Three-dimensional micro-drive four-electrode replaceable probe

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Embodiment Construction

[0016] The three-dimensional micro-drive four-electrode replaceable probe of the present invention will be described below with reference to the accompanying drawings.

[0017] The three-dimensional micro-drive four-electrode replaceable probe of the present invention such as figure 1 As shown, it includes: a four-electrode probe base 1; a three-dimensional micro-drive four-electrode base 12 matched with the four-electrode probe base.

[0018] A four-electrode probe slot is provided at the center of the top needle point frame 5 of the four-electrode probe base 1 , which just matches the four-probe integrated sheet 2 . The threaded rod at the bottom of the copper needle point frame matches the internal thread of the four-electrode base 12 of the three-dimensional microdrive. The lower end of the threaded rod is three annular hollow copper electrodes 13, 14, 15 which are insulated and isolated by ceramic sheets. These three electrodes pass through the corresponding first copper...

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Abstract

The invention discloses a three-dimensional micro-drive four-electrode replaceable probe, which comprises a four-electrode probe holder and a three-dimensional micro-drive four-electrode base matched with the four-electrode probe holder. Three copper electrodes isolated by ceramic insulation sheets are arranged at the bottom of a threaded rod of a probe tip frame of the four-electrode probe holder, contact with four electrodes on the inner wall of a scanatron of the three-dimensional micro-drive four-electrode base together with the threaded rod of the probe tip frame respectively, and are led out through four bundles of copper conductors to be used as input and output terminals for measurement. A probe frame of a scanning tunneling microscope also can be arranged by a thread on the upper part of the inner wall of the scanatron of the three-dimensional micro-drive four-electrode base, so that four-probe transport measurement and single-probe surface scanning are compatible. By the structure combining direct insertion and the thread, the electrodes can contact stably and firmly, and can bear abrasion caused by frequent replacement for use.

Description

technical field [0001] The invention relates to an electrode probe, in particular to a three-dimensional micro-drive four-electrode probe used in an ultra-high vacuum environment. Background technique [0002] The atomic structure and electronic state of the outermost layer of crystal materials often show characteristics different from their bulk state, which has become a research hotspot in many disciplines such as physics, materials and chemistry in both basic and applied aspects. Scanning tunneling microscope is an important research instrument in this field of scientific research. [0003] In view of the fact that the surface of many materials is easily polluted by the atmosphere, most scanning tunneling microscopes work in ultra-high vacuum; a single probe with a sharp needle is inserted into a three-dimensional micro-drive single-electrode probe to achieve atomic-scale morphology observation with electronic density of states measurements. If you want to obtain the el...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/16
Inventor 刘灿华葛剑峰贾金锋
Owner SHANGHAI JIAO TONG UNIV
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