Oblique scan display method in direct writing photoetching system
A lithography system and oblique scanning technology, which is applied in the field of oblique scanning display in direct-write lithography systems, can solve the problems of reducing image resolution and minimum line width, and achieve the effect of optimizing working mode and improving efficiency
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[0024] The invention is a method for obliquely scanning and displaying images in a direct writing photolithography system.
[0025] refer to figure 1 , figure 2 , the micromirror DMD1 of the present invention is fixedly installed with an inclination, the micromirror DMD1 rotates 14.0362 ° counterclockwise when the tilt factor N=4, and the micromirror DMD1 rotates 7.125 ° counterclockwise when the tilt factor N=8, selects the tilt factor N= in the present embodiment 4; The exposure surface is sucked on the platform 2 and can move back and forth in the Y direction. exist figure 2 The figure shows the 5×8 partial diagram of the micromirror DMD1 installed obliquely. It can be seen from the figure that when the tilt factor N=4, the rotation angle θ=14.0362°. Assuming that the length and width of a projected pixel are respectively pl, it can be Calculate pw=pl×0.24254, the centers of two columns of pixels connected by the tilted micromirror DMD1 are 4pw in X direction and 1...
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