Electron beam focusing device for X-ray tube

Abstract

Disclosed is an electron beam focusing device for an X-ray tube. A filament, an electron beam focusing regulating unit and an anode target are arranged in an X-ray seal pipe barrel, a vacuum pump is connected with the X-ray seal pipe barrel through a pipeline, a high voltage power supply unit is connected with the X-ray seal pipe barrel through a high voltage cable, and an electronic control unit is connected with the electron beam focusing regulating unit. The focusing device integrates the modern control technique, the modern material technique and the modern nondestructive testing technique to focus electron beams so as to enable the focal spot effects to achieve approximate point light source effects. When the device is used in X-ray nondestructive testing, the X-ray image resolution is higher during imaging, therefore negative judgment or misjudgment for defects of articles to be tested can be reduced obviously according to the image effects, and the inspection effects for the articles to be tested are more truthful.

Description

technical field [0001] The invention relates to a component of an X-ray nondestructive testing device, in particular to an electron beam focusing device used in an X-ray tube. Background technique [0002] At present, X-ray inspection devices are widely used, and there are many types of X-ray tubes as the key components. The electron beams emitted by conventional X-ray nondestructive inspection devices are discrete, and the focusing effect is average, which cannot achieve a focal spot similar to that of a point light source. The effect cannot reach the theoretical detection result. Contents of the invention [0003] Aiming at the problems existing in the focusing of X-ray tubes in current X-ray non-destructive testing devices, the present invention provides an X-ray tube electron beam focusing device capable of focusing electron beams so that the focal spot effect is similar to that of a point light source. [0004] The specific technical measures taken to solve the above...

AI Technical Summary

Problems solved by technology

[0002] At present, X-ray inspection devices are widely used, and there are many kinds of X-ray tubes as the key components. The electron beams emitted by conventional X-ray non-destructive inspection devices are discrete, and the focusing effect is average, and the focal spot similar to that of a point light source cannot be achieved. effect, can not achieve the theoretical test results

Images