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Conversion circuit and chip

A conversion circuit and converter technology, applied in the direction of code conversion, analog-to-digital converter, analog-to-digital conversion, etc., can solve problems such as long test time, achieve the effect of solving test time, shortening test time, and avoiding waste

Active Publication Date: 2015-09-30
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] In view of this, aiming at the defects in the prior art, the present invention provides a conversion circuit and chip, which is used to solve the problem that a long test time is required for testing the ADC in the prior art

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  • Conversion circuit and chip
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Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Apparently, each of the following embodiments is only a part of the present invention. Based on the following embodiments of the present invention, even if those skilled in the art do not make creative work, they can obtain other technical features that can solve the technical problems of the present invention and realize the technical effects of the present invention by equivalently transforming some or even all of the technical features. Embodiments, and these transformed embodiments obviously do not depart from the disclosed scope of the present invention.

[0029] Such as figure 1 as shown, figure 1 A schematic structural diagram of a conversion circuit provided in an embodiment of the present inven...

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Abstract

The present invention provides a conversion circuit including: an inputting unit, a DAC connected to the inputting unit, an ADC connected to an output end of the DAC, and a comparing unit connected to an output end of the ADC. The comparing unit compares a test code set output by the ADC with a second standard test code set, and if the comparison result is in a preset error range, notify a test data collecting unit; otherwise, output the comparison result to a correcting unit. The correcting unit obtains a complementary code set according to the comparison result, and output the complementary code set to the inputting unit, so that the inputting unit updates the standard test code set according to the complementary code set and obtains the updated first standard test code set. The test data collecting unit obtains a voltage value of an input end of the ADC.

Description

technical field [0001] Embodiments of the present invention relate to circuit technology, and in particular to a conversion circuit and a chip. Background technique [0002] In industrial applications, it is necessary to calculate the static parameters of the Analog-to-Digital Converter (ADC for short). To calculate the static parameters of the ADC, it is necessary to collect the output code of the ADC and the corresponding input voltage. However, due to the transmission characteristic curve of the ADC It is a many-to-one corresponding function, which makes the existing test circuit for testing the ADC relatively cumbersome and requires a very long test time. [0003] For example, in the prior art, methods such as multi-point sampling linear ladder histogram method or histogram method are used to test the static parameters of the ADC, such as integral nonlinearity (Integral nonlinearity, INL for short), differential nonlinearity (Differential Nonlinearity , referred to as D...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03M1/10
CPCH03M1/12H03M1/109
Inventor 邓开平熊涛
Owner HUAWEI TECH CO LTD